“…1 and detailed description can be found in [6]. It uses an industrial robotic arm to precisely move the reference antenna around the AUT and probe the radiated field at the desired measurement points.…”
Abstract-In this paper the results of integrated antenna measurements are analyzed to identify the main reflection locations when measuring with wafer probes. Two different approaches are described and the measurement results for two different probe designs are shown. First, the main reflection center on the wafer probe is determined by analyzing the measured far field radiation pattern at 160 GHz. The second approach is based on an extrapolation measurement of the antenna. It is shown that the reflective areas can be identified for both probe designs. The results can be used to assess the measurement uncertainty and to quantify the measurement error.
“…1 and detailed description can be found in [6]. It uses an industrial robotic arm to precisely move the reference antenna around the AUT and probe the radiated field at the desired measurement points.…”
Abstract-In this paper the results of integrated antenna measurements are analyzed to identify the main reflection locations when measuring with wafer probes. Two different approaches are described and the measurement results for two different probe designs are shown. First, the main reflection center on the wafer probe is determined by analyzing the measured far field radiation pattern at 160 GHz. The second approach is based on an extrapolation measurement of the antenna. It is shown that the reflective areas can be identified for both probe designs. The results can be used to assess the measurement uncertainty and to quantify the measurement error.
For meaningful pattern measurements of integrated antennas the devices, which are required during the measurement process, need to be optimized to influence the measurement results as little as possible. In this paper the errors caused by reflections on the chuck are investigated and quantified. A plastic chuck was built to reduce sources of reflection and thus improve the overall accuracy of the setup. The new chuck causes less ripples over the scanning angle and over the frequency and therefore, increases the performance of the setup significantly.
“…[2] shows a similar approach at 5 GHz. This paper mainly focuses on the measurement setup presented in [3], but can be applied to different setups as well. A block diagram of the setup is shown in Fig.…”
Measurements of integrated antennas are often cumbersome and erroneous. Inaccuracies of the measurement setup, unknown material parameters, and metal parts in the immediate surrounding of the antenna under test (AUT) cause errors to the measured parameters. In order to be able to measure integrated antennas at frequencies beyond 100 GHz with high accuracy, a dedicated measurement setup was developed. For the quantification of the accuracy of the setup various measurements with different parameters were taken and their individual impact on the result was analyzed. On this basis the accuracy of measured antenna parameters like gain, directivity, and radiation pattern at 280 GHz was calculated as well as their sensitivity towards certain uncertainties in the measurement process.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.