2017 11th European Conference on Antennas and Propagation (EUCAP) 2017
DOI: 10.23919/eucap.2017.7928229
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Scattering center determination for integrated antenna measurements at mm-wave frequencies

Abstract: Abstract-In this paper the results of integrated antenna measurements are analyzed to identify the main reflection locations when measuring with wafer probes. Two different approaches are described and the measurement results for two different probe designs are shown. First, the main reflection center on the wafer probe is determined by analyzing the measured far field radiation pattern at 160 GHz. The second approach is based on an extrapolation measurement of the antenna. It is shown that the reflective area… Show more

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Cited by 3 publications
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“…Interference from wafer probes can disturb integrated antenna measurements such that the results are unfit for a meaningful AUT characterization and are the main source of reflection for integrated antenna measurements [13], [24]. Therefore, the MARS algorithm was applied to a wafer probe measurement to improve the result.…”
Section: Integrated Antenna Measurementsmentioning
confidence: 99%
“…Interference from wafer probes can disturb integrated antenna measurements such that the results are unfit for a meaningful AUT characterization and are the main source of reflection for integrated antenna measurements [13], [24]. Therefore, the MARS algorithm was applied to a wafer probe measurement to improve the result.…”
Section: Integrated Antenna Measurementsmentioning
confidence: 99%