Review of electronic speckle pattern interferometry (ESPI) for three dimensional displacement measurement

Yang, Lianxiang; Xie, Xin; Zhu, Lianqing; Wu, Sijin; Wang, Yonghong

doi:10.3901/cjme.2014.01.001

Cited by 106 publications

(48 citation statements)

References 44 publications

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“…The principle of phase contrast, discovered for visible light in the 1930s [13], had been successfully translated to the X-ray regime in 1965 [14], but received increased attention only with the advent of third-generation synchrotrons providing wider access to highly brilliant, coherent and monochromatic X-rays. Since then, X-ray phase-contrast imaging has seen numerous developments and found a large range of applications, e.g., for biomedical, for stress, strain and vibration measurements of rough surfaces [104][105][106][107][108] and dynamic speckle for the investigation of biological processes [109][110][111][112][113][114]. Even the use of laser speckle for eye testing has been demonstrated [115].…”

Section: Introductionmentioning

confidence: 99%

State of the Art of X-ray Speckle-Based Phase-Contrast and Dark-Field Imaging

Zdora

2018

J. Imaging

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Abstract:In the past few years, X-ray phase-contrast and dark-field imaging have evolved to be invaluable tools for non-destructive sample visualisation, delivering information inaccessible by conventional absorption imaging. X-ray phase-sensing techniques are furthermore increasingly used for at-wavelength metrology and optics characterisation. One of the latest additions to the group of differential phase-contrast methods is the X-ray speckle-based technique. It has drawn significant attention due to its simple and flexible experimental arrangement, cost-effectiveness and multimodal character, amongst others. Since its first demonstration at highly brilliant synchrotron sources, the method has seen rapid development, including the translation to polychromatic laboratory sources and extension to higher-energy X-rays. Recently, different advanced acquisition schemes have been proposed to tackle some of the main limitations of previous implementations. Current applications of the speckle-based method range from optics characterisation and wavefront measurement to biomedical imaging and materials science. This review provides an overview of the state of the art of the X-ray speckle-based technique. Its basic principles and different experimental implementations as well as the the latest advances and applications are illustrated. In the end, an outlook for anticipated future developments of this promising technique is given.

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Section: Introductionmentioning

confidence: 99%

State of the Art of X-ray Speckle-Based Phase-Contrast and Dark-Field Imaging

Zdora

2018

J. Imaging

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“…Also, thickness distribution can be calculated based on Eq. (13). Then thickness variations along horizontal direction can be obtained.…”

Section: Resultsmentioning

confidence: 99%

Determination of thickness uniformity of a transparent film based on in-plane ESPI and radial basis function

Dai

Shao

Yang

et al. 2016

Optics Communications

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“…Digital Speckle Pattern Interferometry (DSPI) is a well-established technique used for deformation, displacement, vibration measurement, and nondestructive testing [1][2][3] . It has been frequently used in aerospace engineering and other high-tech industries to evaluate the properties and structures of materials, or for nondestructive testing of composite materials.…”

Section: Introductionmentioning

confidence: 99%

Investigation of hidden diffuse surfaces using phase-shifting endoscopic digital speckle pattern interferometry

Zhu

Yang

2015

Ninth International Symposium on Precision Engineering Measurement and Instrumentation

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Digital speckle pattern interferometry (DSPI) is an important optical tool which is widely used in many sophisticated applications. However, a traditional DSPI system can only be used to investigate the outer surfaces which can be easily observed. Therefore, an endoscopic DSPI was proposed to detect the internal and hidden surfaces. It has a rigid or flexible endoscopic tube to allow a hidden surface being clearly imaged. A Fiber-optics-based setup makes the proposed DSPI system compact and robust. The temporal phase-shifting technique is used to help precise extraction of phase distributions from speckle patterns.

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Review of electronic speckle pattern interferometry (ESPI) for three dimensional displacement measurement

Cited by 106 publications

References 44 publications

State of the Art of X-ray Speckle-Based Phase-Contrast and Dark-Field Imaging

State of the Art of X-ray Speckle-Based Phase-Contrast and Dark-Field Imaging

Determination of thickness uniformity of a transparent film based on in-plane ESPI and radial basis function

Investigation of hidden diffuse surfaces using phase-shifting endoscopic digital speckle pattern interferometry

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