2006
DOI: 10.1016/j.mejo.2005.07.002
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Review of CMOS image sensors

Abstract: The role of CMOS Image Sensors since their birth around the 1960s, has been changing a lot. Unlike the past, current CMOS Image Sensors are becoming competitive with regard to Charged Couple Device (CCD) technology. They offer many advantages with respect to CCD, such as lower power consumption, lower voltage operation, on-chip functionality and lower cost. Nevertheless, they are still too noisy and less sensitive than CCDs.Noise and sensitivity are the key-factors to compete with industrial and scientific CCD… Show more

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Cited by 486 publications
(248 citation statements)
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“…By contrast, CMOS Active Pixel Sensors (APSs) (Fossum 1995, Bigas et al 2006, Holst and Lomheim 2011 have started to emerge as a serious alternative to FPIs in the medical imaging field, showing potential to overcome many of the limiting drawbacks of FPIs. In fact CMOS APSs are now capable of offering low noise (60−150 e − ) (Arvanitis et al 2007, Bohndiek et al 2009, Esposito et al 2011, as each pixel contains an active circuit (Zentai and Colbeth 2012), and a pixel pitch in the order of 25 − 50 µm, deriving from higher resolution lithographic processes and higher levels of integration reached in the CMOS manufacturing processing, technically and economically driven by integrated circuit applications (Lo 1998).…”
Section: Introductionmentioning
confidence: 99%
“…By contrast, CMOS Active Pixel Sensors (APSs) (Fossum 1995, Bigas et al 2006, Holst and Lomheim 2011 have started to emerge as a serious alternative to FPIs in the medical imaging field, showing potential to overcome many of the limiting drawbacks of FPIs. In fact CMOS APSs are now capable of offering low noise (60−150 e − ) (Arvanitis et al 2007, Bohndiek et al 2009, Esposito et al 2011, as each pixel contains an active circuit (Zentai and Colbeth 2012), and a pixel pitch in the order of 25 − 50 µm, deriving from higher resolution lithographic processes and higher levels of integration reached in the CMOS manufacturing processing, technically and economically driven by integrated circuit applications (Lo 1998).…”
Section: Introductionmentioning
confidence: 99%
“…This limit defines the maximal frame rate of the detector (Bigas et al 2006). In benchtop systems, the exposure times necessitated by the comparatively weak flux (generally > > 50 ms) mean this limit is not exceeded.…”
Section: Future Challenges and Opportunitiesmentioning
confidence: 99%
“…This is why noise contributors should be dealt with by reducing their impact on the useful signals. CMOS imagers are known to suffer from various noise sources which can be classified either as temporal noise or FPN [31]. Temporal noise (e.g.…”
Section: Noise Removalmentioning
confidence: 99%