Microelectronics Reliability
 1975
DOI: 10.1016/0026-2714(75)90162-6
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Results of a 160 × 106 device-hour reliability assessment and failure analysis of TTL SSI integrated circuits, part 2 survey of dominant IC failure mechanisms and analysis of failure causes

Andras Kemeny1,
G. Kalmár2,
V. Stefániay
3
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