2019
DOI: 10.1109/access.2019.2923242
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Research on ELM Soft Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction

Abstract: In order to improve the capability of soft fault diagnosis in an analog circuit, an integrated diagnosis method based on KSLPP feature extraction and ELM is proposed. The KSLPP feature extraction ability is firstly used to construct the principal component feature set from the fault sample set. Then, the advantage of ELM on solving the complicated nonlinearity problem is applied to build the fault identification model from the principal component feature. Finally, the sample sets of soft fault diagnosis for th… Show more

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Cited by 30 publications
(14 citation statements)
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References 20 publications
(19 reference statements)
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“…The penalty parameter C and kernel parameter γ of SVM are tuned according to IH-PSO. According to formulas (7) to (9), the position and velocity of the particles are updated to generate a new particle group.…”
Section: B Fault Diagnosis Process Based On Ih-pso Optimized Svmmentioning
confidence: 99%
See 1 more Smart Citation
“…The penalty parameter C and kernel parameter γ of SVM are tuned according to IH-PSO. According to formulas (7) to (9), the position and velocity of the particles are updated to generate a new particle group.…”
Section: B Fault Diagnosis Process Based On Ih-pso Optimized Svmmentioning
confidence: 99%
“…Soft fault, also known as parametric fault [5], [6] is caused by parametric drift, which will not cause damage to the circuit hardware. Due to the continuity of components parameters, the insufficiency of diagnostic information in actual test circuits, as well as the tolerance impact of analog components [7]- [9], parameter fault diagnosis is rather complicated. It is rather troublesome for traditional methods like signal processing or analytical models to meet the needs.…”
Section: Introductionmentioning
confidence: 99%
“…The extreme learning machine (ELM) proposed by Guang-Bin Huang et al in 2004 provides a unified learning platform with a wide range of feature mapping types, and thus can approximate any continuous objective function, making classification of disjoint areas possible. Since they have better scalability, stronger generalization and faster learning speeds than SVMs [16], ELMs have been widely used in the fields of fault diagnosis, such as transmission line fault diagnosis [17], rolling bearing fault diagnosis [18][19][20], and analog circuit fault diagnosis [21,22]. In the field of transformer fault diagnosis, Hasmat Malik and Sukumar Mishra [23] applied a principal component analysis on International Electrotechnical Commission Technical Committee (IEC TC) 10 DGA data to find the most relevant variables first and then used an ELM to classify early transformer faults.…”
Section: Introductionmentioning
confidence: 99%
“…Since establishment of modeling approaches is a great challenge, data-driven approaches have become more popular as they combine feature extraction and classification techniques into a single learning body. Reviewing the literature indicates that commonly used data-driven approaches are the artificial neural network (ANN) [17]- [22], support vector machine (SVM) [23], [24], and other machine learning methods [27], [28]. Zhao et al [17] proposed an intelligent solution based on the deep belief network (DBN), which has higher classification accuracy and lower requirements on data.…”
Section: Introductionmentioning
confidence: 99%