2023
DOI: 10.1016/j.ceramint.2022.11.122
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Remotely tuned multistate resistive switching in MoS2/NiMnIn thin film heterostructure for highly flexible ReRAM application

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Cited by 19 publications
(29 citation statements)
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“…89-2482] . In addition, the XRD peaks (311) and (111) at 2θ ∼50.35 and ∼25.45°, respectively, are related to the NiMnIn bottom electrode. ,, The layer structure was confirmed by plotting the Raman spectra of the sputter-deposited V 2 O 5 active switching layer (Figure c). The bonding vibration modes obtained at wave numbers 145, 284, 490, 690, and 994 cm –1 are in good concordance with previously published data.…”
Section: Resultsmentioning
confidence: 83%
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“…89-2482] . In addition, the XRD peaks (311) and (111) at 2θ ∼50.35 and ∼25.45°, respectively, are related to the NiMnIn bottom electrode. ,, The layer structure was confirmed by plotting the Raman spectra of the sputter-deposited V 2 O 5 active switching layer (Figure c). The bonding vibration modes obtained at wave numbers 145, 284, 490, 690, and 994 cm –1 are in good concordance with previously published data.…”
Section: Resultsmentioning
confidence: 83%
“…The response of the NiMnIn-integrated heterostructure memory device to the temperature and magnetic field was analyzed by plotting the magnetic moment vs temperature ( M – T ) and magnetic moment vs magnetic field ( M – H hysteresis curves), as shown in Figure a,b, respectively. The fabricated V 2 O 5 /NiMnIn heterostructure shows the structural transformation from high-temperature austenite to a low-temperature martensite regime with a transition around ∼280° K (Figure a). ,, The well-saturated M – H curves signify the ferromagnetic behavior of the NiMnIn layer (Figure b). The larger magnetization observed at ∼282 K corresponds to the mixed phase of the FSMA layer.…”
Section: Resultsmentioning
confidence: 97%
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