Reliability enhancement by the reversal of token for a basic token ring in the case of a single component failure

Chakraborty, Rajarshi; Yaprak, Ece; Anneberg, L.

doi:10.1016/0026-2714(94)90110-4

Microelectronics Reliability

1994

DOI: 10.1016/0026-2714(94)90110-4

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Reliability enhancement by the reversal of token for a basic token ring in the case of a single component failure

Rajarshi Chakraborty

Ece Yaprak

L. Anneberg

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Reliability enhancement by the reversal of token for a basic token ring in the case of a single component failure

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References 3 publications

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