Reliability analysis of CMOS inverter subjected to AC &amp;amp; DC NBTI stresses

Chenouf, Amel; Djezzar, Boualem; Benadelmoumene, Abdelmadjid; Tahi, Hakim; Goudjil, Mohamed

doi:10.1109/idt.2014.7038602

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Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses

Cited by 5 publications

References 11 publications

Evaluation of mirror full adder circuit reliability performance due to negative bias temperature instability (NBTI) effects based on different defect mechanisms

Evaluation of mirror full adder circuit reliability performance due to negative bias temperature instability (NBTI) effects based on different defect mechanisms

Stability of Rotary Traveling Wave Oscillators under process variations and NBTI

Investigation of Negative Bias Temperature Instability (NBTI) Effects on Standard Cell Library Circuits Performance

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