"REIS-IE" X-ray tester: description, qualification technique and results, dosimetry procedure

Artamonov, A. S.; Chumakov, A. I.; Eremin, V. V.; Figurov, I.; Kalashnikov, O. A.; Nikiforov, Oleg; Sogojan, O.

doi:10.1109/redw.1998.731498

Cited by 21 publications

(3 citation statements)

References 7 publications

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“…All radiation experiments were supported by soft-hardware automated test setup (ATS) that had been developed for DC-DC's functional and parametrical control [17][18][19][20][21].…”

Section: Device-under-test and Experimental Set-upmentioning

confidence: 99%

DC–DC's total ionizing dose hardness decrease in passive reserve mode

Kessarinskiy

Borisov

Boychenko

et al. 2015

Microelectronics Reliability

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“…All radiation experiments were supported by soft-hardware automated test setup (ATS) that had been developed for DC-DC's functional and parametrical control [17][18][19][20][21].…”

Section: Device-under-test and Experimental Set-upmentioning

confidence: 99%

DC–DC's total ionizing dose hardness decrease in passive reserve mode

Kessarinskiy

Borisov

Boychenko

et al. 2015

Microelectronics Reliability

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“…The specialized X-ray tester "REIS-IM" and linear electron accelerator "ARSA" (gamma mode) were used in experiments [6]. As shown on Fig.2 Bias voltage was applied to the sensors during irradiation with dose rate 200 rd(Si)/s.…”

Section: Te St Te Chnique and Res Ultsmentioning

confidence: 99%

Radiation effects in piezoelectric sensor

Boychenko¹,

Nikiforov²,

Skorobogatov³

et al. 2007

2007 9th European Conference on Radiation and Its Effects on Components and Systems

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“…Testing procedure of microelectronic parts, i.e., integrated circuits (ICs), semiconductor devices, solid-state microwave electronics and electronic modules for compliance with nuclear and space radiation hardness regulations can be based on various radiation facilities that initiate total ionizing dose (TID) effects [1], [2] in devices under test (DUT).…”

Section: Introductionmentioning

confidence: 99%