Reflection high-energy electron diffraction during substrate rotation: A new dimension forin situcharacterization

Abstract

Articles you may be interested inReflection high-energy electron diffraction and scanning tunneling microscopy study of InP (001) We present two methods to access reciprocal space with reflection high-energy electron diffraction ͑RHEED͒ during substrate rotation. The extraction of an arbitrary number of still frames from a continuously changing RHEED pattern is realized by triggering the substrate rotation and it allows analysis of quasistatic RHEED patterns that are updated every revolution. At the same time, the intensity along a line parallel to the shadow edge can be used to reconstruct a planar cut through the reciprocal lattice similar to a low-energy electron diffraction pattern. This RHEED pattern directly reveals the symmetry of the surface reconstruction and its changes during the deposition process.

MgO films grown on yttria-stabilized zirconia by molecular beam epitaxy

“…Azimuthal RHEED scans [20] were collected to determine the growth orientation. An example of such a pattern, taken from the films grown at 450 1C, is shown in the inset of Fig.…”

Reflection high-energy electron diffraction study of molecular beam epitaxy growth of Pr2O3 on Si(0 0 1)

“…A detailed description of the measurement principle can be found in Refs. [29,30]. In the current azimuthal scan, we record the intensity along a line parallel to the shadow edge through the 404 spot while the substrate rotates.…”

Structure analysis of thin iron-silicide film from φ-scan RHEED Patterson function

“…The transformation of the RHEED intensity distribution from the φ-scan requires the refined intensity convertion procedure, as well as sufficiently good φ-scan experimental conditions. It has been carried out by Braun [15] in two dimensions, for instance. Here, we have transformed the RHEED intensities in three dimensions.…”