Recovery of the Electrical Parameters of Degraded Solar Cells by Ultrasonic Treatment

Abstract

-In the lifetime of solar cells and under normal operating conditions, electrical parameters of solar cells are degrading continuously because solar cells are ageing during outdoor exposure, which could deteriorate their electrical characteristics. In this paper, to simulate and accelerate the effects of aging, solar cells are exposed to the different doses of gamma radiation, since gamma radiation and aging produces similar effects in semiconducting devices. The electrical parameters of degraded silicon solar cells can be significantly recovered by ultrasonic treatment (UST). The restores of the silicon solar cells parameters such as efficiency (η), open circuit voltage (V oc ), short circuit current (I sc ), among other, after ultrasonic treatment is related to a redistribution of the radiation defects and an increase in the homogeneity of a solar cells crystal structure.

Investigation of the Effect of Successive Low-Dose Gamma-Rays on c-Si Solar Cell

“…Düşük dozda gözlenen azalma, azınlık yük taşıcılarının yaşam süreleri veya difüzyon uzunluğundaki azalma ile ilişkilendirilmektedir [9,22,23]. Radyasyon indüklü oluşan kusurlar yarıiletken malzemenin band aralığı içerisinde yeni tuzak enerji seviyeleri oluşturarak azınlık yük taşıyıcılarının ömürlerinin azalmasına neden olmaktadır [24]. Bu nedenle, azınlık yük taşıyıcılarının yaşam süreleri -indüklü kusurlara duyarlı olup, bu durum güneş hücrelerinin elektriksel özelliklerini olumsuz etkilemektedir [25].…”

Investigating improvement in the performance of WS2 absorber layer based thin film solar cell with a hole transport layer of Indium Telluride

“…It is revealed that V OC , FF and PCE decreases while increasing the temperature while J SC increases almost linearly in both cases. Increased temperature can cause reduction in the band gaps and can increase the collision between electron hole pairs and other atoms which leads to increase the recombination, so it will decrease the overall performance of the device [33][34][35]. It is also found that all the parameters provide better results in case of the device with hole transport layer.…”

Experimental study of static and dynamic behaviours of cracked PV panels

“…where τ is a minority carrier of lifetime. According to [24][25][26] minority carrier lifetime is highly degraded by the solar cell ageing during outdoor exposure. Thus, the electrical parameters of the solar cell are more likely to change with time.…”

“…The diffusion capacitance is notable during forward‐bias of the p–n junction, and its value depends on the frequency and voltage according to [22] where is a minority carrier of lifetime. According to [24–26] minority carrier lifetime is highly degraded by the solar cell ageing during outdoor exposure. Thus, the electrical parameters of the solar cell are more likely to change with time.…”