2020
DOI: 10.1002/advs.201901391
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Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy

Abstract: Piezoelectric and ferroelectric materials have garnered significant interest owing to their excellent physical properties and multiple potential applications. Accordingly, the need for evaluating piezoelectric and ferroelectric properties has also increased. The piezoelectric and ferroelectric properties are evaluated macroscopically using laser interferometers and polarization–electric field loop measurements. However, as the research focus is shifted from bulk to nanosized materials, scanning probe microscop… Show more

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Cited by 47 publications
(31 citation statements)
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“…SS-PFM is typically performed at a fixed point by applying a pulse-type triangular bias voltage waveform. 52 The hysteresis amplitude and phase loops can be obtained by applying a probing ac voltage while the dc voltage is in the off state. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…SS-PFM is typically performed at a fixed point by applying a pulse-type triangular bias voltage waveform. 52 The hysteresis amplitude and phase loops can be obtained by applying a probing ac voltage while the dc voltage is in the off state. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…[ 2–5,6 ] In recent years, however, the extensive application of PFM has revealed a growing number of challenges and concerns about this technique and its interpretation, which is greatly challenging its validity in many ferroelectric studies recently. [ 6–13 ] Among these concerns, the signal source issue is pressingly pending to be addressed because the source of the signal is of fundamental importance for reaching correct interpretation of the PFM results. [ 6–8,13 ]…”
Section: Introductionmentioning
confidence: 99%
“…[ 6–13 ] Among these concerns, the signal source issue is pressingly pending to be addressed because the source of the signal is of fundamental importance for reaching correct interpretation of the PFM results. [ 6–8,13 ]…”
Section: Introductionmentioning
confidence: 99%
“…Thus, it is important to use direct imaging techniques to study the characteristics of domain structure [ 18 , 19 , 20 ]. Scanning probe microscopy (SPM), which allows the high-resolution and nondestructive imaging for domain structures and observation of their dynamic behaviors on the micro and nanoscale, has been used [ 21 , 22 , 23 , 24 ]. The research of ferroelectric surface science using SPM has provided deep insight into the structure and dynamics of ferroelectrics [ 25 , 26 , 27 ].…”
Section: Introductionmentioning
confidence: 99%