Recent Developments in Femtosecond Laser-Enabled TriBeam Systems

Echlin, McLean P.; Polonsky, Andrew; Lamb, James; Geurts, Remco; Randolph, Steven; Botman, Aurélien; Pollock, Tresa M.

doi:10.1007/s11837-021-04919-0

Cited by 26 publications

(10 citation statements)

References 111 publications

(148 reference statements)

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“…The TriBeam system 3 , 14 is used for the collection of orientation fields in 3D over a half cubic millimeter volume. A schematic of the overall experiment is provided in Fig.…”

Section: Methodsmentioning

confidence: 99%

Multi-modal Dataset of a Polycrystalline Metallic Material: 3D Microstructure and Deformation Fields

et al. 2022

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The development of high-fidelity mechanical property prediction models for the design of polycrystalline materials relies on large volumes of microstructural feature data. Concurrently, at these same scales, the deformation fields that develop during mechanical loading can be highly heterogeneous. Spatially correlated measurements of 3D microstructure and the ensuing deformation fields at the micro-scale would provide highly valuable insight into the relationship between microstructure and macroscopic mechanical response. They would also provide direct validation for numerical simulations that can guide and speed up the design of new materials and microstructures. However, to date, such data have been rare. Here, a one-of-a-kind, multi-modal dataset is presented that combines recent state-of-the-art experimental developments in 3D tomography and high-resolution deformation field measurements.

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“…The TriBeam system 3 , 14 is used for the collection of orientation fields in 3D over a half cubic millimeter volume. A schematic of the overall experiment is provided in Fig.…”

Section: Methodsmentioning

confidence: 99%

Multi-modal Dataset of a Polycrystalline Metallic Material: 3D Microstructure and Deformation Fields

et al. 2022

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“…In ZEISS systems, the laser unit exists as a secondary attached chamber to the FIB‐SEM chamber, allowing for correlation and reduction of contamination/detector damage in the main vacuum chamber. There are also systems with lasers integrated within (p)FIB‐SEMs, or TriBeam systems, 25 for an additional range of beams (and scales of material removal) to use in instruments. All of these instruments also have the flexibility and advantage of being ideal for preparing samples for other techniques, such as TEM, atom probe tomography (APT), and even nanotomography/XRM.…”

Section: Methods Of Sample Materials Removalmentioning

confidence: 99%

Methods to expose subsurface objects of interest identified from 3D imaging: The intermediate sample preparation stage in the correlative microscopy workflow

Mitchell

Dunlop

Volkenandt

et al. 2022

Journal of Microscopy

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The correlative imaging workflow is a method of combining information and data across modes (e.g. SEM, X‐ray CT, FIB‐SEM), scales (cm to nm) and dimensions (2D–3D–4D), providing a more holistic interpretation of the research question. Often, subsurface objects of interest (e.g. inclusions, pores, cracks, defects in multilayered samples) are identified from initial exploratory nondestructive 3D tomographic imaging (e.g. X‐ray CT, XRM), and those objects need to be studied using additional techniques to obtain, for example, 2D chemical or crystallographic data. Consequently, an intermediate sample preparation step needs to be completed, where a targeted amount of sample surface material is removed, exposing and revealing the object of interest. At present, there is not one singular technique for removing varied thicknesses at high resolution and on a range of scales from cm to nm. Here, we review the manual and automated options currently available for targeted sample material removal, with a focus on those methods which are readily accessible in most laboratories. We summarise the approaches for manual grinding and polishing, automated grinding and polishing, microtome/ultramicrotome, and broad‐beam ion milling (BBIM), with further review of other more specialist techniques including serial block face electron microscopy (SBF‐SEM), and ion milling and laser approaches such as FIB‐SEM, Xe plasma FIB‐SEM, and femtosecond laser/LaserFIB. We also address factors which may influence the decision on a particular technique, including the composition, shape and size of the samples, sample mounting limitations, the amount of surface material to be removed, the accuracy and/or resolution of peripheral parts, the accuracy and/or resolution of the technique/instrumentation, and other more general factors such as accessibility to instrumentation, costs, and the time taken for experimentation. It is hoped that this study will provide researchers with a range of options for removal of specific amounts of sample surface material to reach subsurface objects of interest in both correlative and non‐correlative workflows.

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“…Very recently, femtosecond pulsed laser ablation has been introduced as a yet more powerful milling approach in dual-beam instruments [26]. While nanosecond lasers have been classically applied for material ablation, their characteristic pulse time enables a noticeable heat transfer to the milled solid, and undesired thermal affects as a consequence.…”

Section: Fib-sem Systems: Technical Developments and State-of-the-artmentioning

confidence: 99%

FIB-SEM tomography in catalysis and electrochemistry

Ródenas

Prieto

2022

Catalysis Today

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Recent Developments in Femtosecond Laser-Enabled TriBeam Systems

Cited by 26 publications

References 111 publications

Multi-modal Dataset of a Polycrystalline Metallic Material: 3D Microstructure and Deformation Fields

Multi-modal Dataset of a Polycrystalline Metallic Material: 3D Microstructure and Deformation Fields

Methods to expose subsurface objects of interest identified from 3D imaging: The intermediate sample preparation stage in the correlative microscopy workflow

FIB-SEM tomography in catalysis and electrochemistry

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