2004
DOI: 10.1103/physrevb.69.045325
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Random diode arrays and mesoscale physics of large-area semiconductor devices

Abstract: Large-area, thin-film semiconductor devices often exhibit strong fluctuations in electronic properties on a mesoscale level that originate from relatively weak microscopic fluctuations in material structures such as grain size, chemical composition, and film thickness. Amplification comes from the fact that electronic transport through potential barriers is exponentially sensitive to the local parameter fluctuations. These effects create new phenomena and establish the physics of large-area, thin-film devices … Show more

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Cited by 69 publications
(40 citation statements)
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References 36 publications
(30 reference statements)
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“…The local drop in the band gap along the grain boundary can act as a weak diode and thus decrease V oc of the entire device [43][44][45][46][47]. According to the "weak diode" analysis, the V oc loss due to the weak diode is proportional to its size.…”
Section: Secondary Phases Along the Grain Boundariesmentioning
confidence: 98%
“…The local drop in the band gap along the grain boundary can act as a weak diode and thus decrease V oc of the entire device [43][44][45][46][47]. According to the "weak diode" analysis, the V oc loss due to the weak diode is proportional to its size.…”
Section: Secondary Phases Along the Grain Boundariesmentioning
confidence: 98%
“…It is notable that CE particularly in short wavelength increases to some extent with the back contact layer. There is always a negative peak caused by the reverse back diode (Karpov et al, 2004) at the back of the device for CdTe absorption edge around 860 nm. The diode exists in the reverse bias condition thus resulting in broader secondary SCR at forward bias.…”
Section: Aqe Results For Fto/sno 2 /Cds/cdte/au Devicesmentioning
confidence: 98%
“…Thin-film semiconductor devices often exhibit characteristics of a network of random diodes connected in parallel [102,[107][108][109] through a resistive electrode to cover those lateral fluctuations by corresponding variations of the local diode parameters. These fluctuations in electronic properties are a result of the material structure fluctuation [109,110] such as grain size, chemical composition, and film thickness between heterointerface and the heterojunction partners [111]. For a correct description of the electronic behavior of cells made from thin films, especially amorphous or polycrystalline absorber material with a large area, the simple equivalent circuit model is not sufficient to describe the bypass behavior of the spatially differentiated layers.…”
Section: Efficiencymentioning
confidence: 97%