2023
DOI: 10.1016/j.jlumin.2022.119440
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Radiative emission mechanism analysis of green InGaN/GaN light-emitting diodes with the Si-doped graded short-period superlattice

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Cited by 3 publications
(2 citation statements)
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“…Figure 1 d shows the normalized integrated emission intensities as a function of the reciprocal temperature for the QD sample. At lower temperature (3.2–30 K), the PL intensity was relatively large because the non-radiative recombination centers are frozen and inactivated, and consider that the internal quantum efficiency (IQE) is 100% at that temperature [ 44 47 ]. As the temperature rises, the PL intensity became smaller due to the non-radiative centers are thermally activated.…”
Section: Materials and Fabricationmentioning
confidence: 99%
“…Figure 1 d shows the normalized integrated emission intensities as a function of the reciprocal temperature for the QD sample. At lower temperature (3.2–30 K), the PL intensity was relatively large because the non-radiative recombination centers are frozen and inactivated, and consider that the internal quantum efficiency (IQE) is 100% at that temperature [ 44 47 ]. As the temperature rises, the PL intensity became smaller due to the non-radiative centers are thermally activated.…”
Section: Materials and Fabricationmentioning
confidence: 99%
“…The commonly used methods include: growing a stress compensation layer in the active region before MQWs; 5,6 using ternary or quaternary compounds with the similarity to the lattice constants of InGaN as quantum barrier layer materials; 7,8 growing MQWs in the nonpolar or semipolar surfaces; 9 and doping GaN quantum barrier layer with silicon, etc. 10 These methods typically use a low indium content waveguide layer for good optical confinement. However, when its indium content is too high compared to the quantum barrier, it causes carriers to accumulate in the waveguide layer and deteriorates device performance.…”
mentioning
confidence: 99%