2014
DOI: 10.1063/1.4902926
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Radiative and interfacial recombination in CdTe heterostructures

Abstract: Double heterostructures (DH) were produced consisting of a CdTe film between two wide band gap barriers of CdMgTe alloy. A combined method was developed to quantify radiative and non-radiative recombination rates by examining the dependence of photoluminescence (PL) on both excitation intensity and time. The measured PL characteristics, and the interface state density extracted by modeling, indicate that the radiative efficiency of CdMgTe/CdTe DHs is comparable to that of AlGaAs/GaAs DHs, with interface state … Show more

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Cited by 46 publications
(15 citation statements)
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“…These are the charge carrier densities relevant for device operation in sunlight. As B is fairly constant below this charge carrier density, we can use Equation (7) to derive a lifetime of order [35][36][37] 130-1300 267 CdTe [38][39][40] 100-5100 195 Si 41,42 0.001-0.01…”
Section: -4mentioning
confidence: 99%
“…These are the charge carrier densities relevant for device operation in sunlight. As B is fairly constant below this charge carrier density, we can use Equation (7) to derive a lifetime of order [35][36][37] 130-1300 267 CdTe [38][39][40] 100-5100 195 Si 41,42 0.001-0.01…”
Section: -4mentioning
confidence: 99%
“…2 layers, has been demonstrated in the previous study by Swartz et al [6]. Similarly, studies of CdTe absorber layer passivation by CdMgTe barrier layers are reported in Refs.…”
Section: Methodsmentioning
confidence: 54%
“…(2) is related to the radiative lifetime. Auger recombination is negligible in CdTe [6] and therefore not included in the above equation.…”
Section: Methodsmentioning
confidence: 99%
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“…[14]- [15] Instead of using the ShockleyRead-Hall (SRH) formula for the recombination rate, or treating the interfacial recombination velocity S as a single physical parameter, full trap capture statistics were used. This is because the SRH formula is only valid in the steady state, and because S is in fact not a constant parameter, but is strongly dependent on excitation III.…”
Section: Photoluminescence Techniquesmentioning
confidence: 99%