Quick test for reversible and irreversible PID of bifacial PERC solar cells

Sporleder, Kai; Turek, Marko; Schüler, Nadine; Naumann, Volker; Hevisov, David; Pöblau, Clemens; Großer, Stephan; Schulte‐Huxel, Henning; Bauer, Jan; Hagendorf, Christian

doi:10.1016/j.solmat.2020.110755

Cited by 21 publications

(30 citation statements)

References 18 publications

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“…[ 10 ] PID‐p due to depolarization was found to be completely reversible by means of illumination, [ 8 ] dark storage, [ 10 ] or high voltage with inverted polarity. [ 15 ]…”

Section: Introductionmentioning

confidence: 99%

“…Furthermore, it was demonstrated on industrially produced PERC+ cells that PID‐c susceptibility can be manipulated in the cell production. [ 15 ] Also, cells can have increased sensitivity to PID‐c at the rear side, when PID test is carried out under simultaneous illumination. [ 15 ] It has been shown that PID‐c performance losses of the solar cell's rear surface are irreversible.…”

Section: Introductionmentioning

confidence: 99%

“…[ 15 ] Also, cells can have increased sensitivity to PID‐c at the rear side, when PID test is carried out under simultaneous illumination. [ 15 ] It has been shown that PID‐c performance losses of the solar cell's rear surface are irreversible. [ 17 ]…”

Section: Introductionmentioning

confidence: 99%

“…[10] PID-p due to depolarization was found to be completely reversible by means of illumination, [8] dark storage, [10] or high voltage with inverted polarity. [15] Second, a corrosive PID type (PID-c) was reported, e.g., in the studies by Sporleder et al…”

mentioning

confidence: 99%

“…[15] Also, cells can have increased sensitivity to PID-c at the rear side, when PID test is carried out under simultaneous illumination. [15] It has been shown that PID-c performance losses of the solar cell's rear surface are irreversible. [17] For quality management in solar cell and module production, it is required to control material and processing parameters with regard to the different PID degradation types.…”

mentioning

confidence: 99%

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Time‐Resolved Investigation of Transient Field Effect Passivation States during Potential‐Induced Degradation and Recovery of Bifacial Silicon Solar Cells

et al. 2021

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Various types of potential‐induced degradation (PID) with fundamentally different physical root causes have been observed recently ranging from shunting (PID‐s), corrosion (PID‐c) to degradation of surface passivation (PID‐p). Herein, PID‐p is investigated for the first time at the rear side of bifacial silicon solar cells with enhanced time‐resolution during degradation and recovery under simultaneous illumination. The tests reveal fast transient changes of rear‐side short‐circuit current within minutes and thus allow to understand the degradation process related to PID‐p. The short‐circuit current with rear‐side illumination first decreases significantly by more than 80 % resulting in an intermediate degraded state. Subsequently, it increases to a regenerated state. Under reversed bias, a total recovery of the cell parameters is observed and confirmed by I–V measurements under standard testing conditions (STCs). The underlying transient PID‐p degradation and recovery mechanism is well described by a PC‐1D simulation of the field‐induced band bending at the rear surface. Finally, a qualitative model involving the migration of mobile charged species and their impact on the charge equilibrium in the field effect passivation layer is presented. Thus, time‐resolved analysis of transient PID effects can serve as a clear characteristic for PID of polarization type.

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“…[ 10 ] PID‐p due to depolarization was found to be completely reversible by means of illumination, [ 8 ] dark storage, [ 10 ] or high voltage with inverted polarity. [ 15 ]…”

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

mentioning

confidence: 99%

mentioning

confidence: 99%

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Time‐Resolved Investigation of Transient Field Effect Passivation States during Potential‐Induced Degradation and Recovery of Bifacial Silicon Solar Cells

et al. 2021

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Review of Potential‐Induced Degradation in Bifacial Photovoltaic Modules

Molto

Mahmood

et al. 2023

Energy Tech

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Bifacial modules are increasingly deployed in the field and are expected to represent half of the market share within 10 years. Their rear structure differs from monofacial modules to allow additional light absorption. However, it brings new reliability challenges to address. In particular, the risk of potential‐induced degradation (PID) is increased as both module sides are impacted. Different PID processes have been identified in the literature: shunting type (PID‐s), polarization type (PID‐p), Na penetration type, and corrosion type (PID‐c). Their occurrence depends on the photovoltaic system configuration as well as the module's materials. Apart from PID‐s, PID processes are not well understood and extensive research is needed to elucidate the PID scenario and underlying mechanisms. Herein, current knowledge about PID processes and their impact on the main bifacial modules in the market are gathered with the aim to guide future research. Bifacial module technologies and leakage current paths leading to PID are described. Indoor and outdoor PID testing methods are detailed. For each bifacial module technology, the PID processes are investigated with their indicators, mechanism and recovery process. PID‐impacting factors and limitation solutions are finally reported and a state of the art on PID modeling is presented.

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Susceptibility to polarization type potential induced degradation in commercial bifacial p‐PERC PV modules

Mahmood

Hacke

et al. 2023

Progress in Photovoltaics

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Potential induced degradation (PID) is a reliability issue affecting photovoltaic (PV) modules, mainly when PV strings operate under high voltages in hot/humid conditions. Polarization‐type PID (PID‐p) has been known to decrease module performance quickly. PID‐p can be reduced or recovered under the light in some cases, but this effect, as expected, would be less pronounced on the rear side of bifacial PV modules receiving lower irradiance. As bifacial PV modules are projected to dominate the PV market within the next 10 years, it is crucial to understand the PID‐p issue in bifacial modules better. In this study, we performed indoor PID testing to induce PID‐p on 14 commercial bifacial p‐PERC modules with three different module constructions from three manufacturers. Four rounds (+ve and −ve polarities for front and rear sides) of PID testing are done at 25°C, 54% relative humidity (RH) for 168 h using the aluminum foil method. Each module side (front cell side and back cell side) is tested individually under both negative and positive voltage bias. The results show that the highest degradation of 32% in maximum power (Pmax) at standard test conditions (1000 W/m2) and 51% at low irradiance (200 W/m2) has been observed in some cases. Recovery under sunlight is also done, and outcomes show a near‐complete recovery in Pmax. This study presents an extensive experimental methodology and a detailed analysis to systematically and simultaneously/sequentially evaluate multiple construction types of bifacial modules to the PID‐p susceptibility and recovery.

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Quick test for reversible and irreversible PID of bifacial PERC solar cells

Cited by 21 publications

References 18 publications

Time‐Resolved Investigation of Transient Field Effect Passivation States during Potential‐Induced Degradation and Recovery of Bifacial Silicon Solar Cells

Time‐Resolved Investigation of Transient Field Effect Passivation States during Potential‐Induced Degradation and Recovery of Bifacial Silicon Solar Cells

Review of Potential‐Induced Degradation in Bifacial Photovoltaic Modules

Susceptibility to polarization type potential induced degradation in commercial bifacial p‐PERC PV modules

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