Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentation

Abstract

Summary Local mechanical properties of submicron features are of particular interest due to their influence on macroscopic material performance and behaviour. This study is focused on local nanomechanical measurements, based on the latest Atomic Force Microscopy (AFM) mode, where the peak force set point is finely controlled at each pixel. After probe calibration, we evaluate the impact of spring constant of two AFM hand‐crafted natural full diamond tips with steel cantilevers, used for mapping. Based on the fast capture of the cantilever deflection at each pixel and real time force curve analysis in the elastic region, AFM local measured contact moduli mappings of the silica beads (>50 GPa) incorporated in an epoxy resin matrix, are compared with those determined using classical instrumented nanoindentation tests. Our analyses show that with the two AFM probes, without local residual deformation, the high moduli of the silica beads measured with this advanced AFM mode are within the standard deviation of the values determined by classical nanoindentation. Lay Description The knowledge of material properties at the nanometer scale is a key parameter for well understanding and determining the behavior of material at macroscopic scale. In this paper, we compare two methods (an advanced mode and a classical one) based on the analysis of probes in interaction with the surface of studied material. We focus on a latest developed mode for determining local mechanical properties with a very high spatial resolution. For the advanced mode, we also consider two different hand‐crafted probes. Our analyses show that with the high spatial resolution advanced mode, local mechanical properties are well determined. We also highlight the impact of the properties of the used probes for this advanced mode. In a final step, the power of the presented investigation lies in the fact that it does not modify the topography of the surface.

Fabrication and Nanoscale Properties of PEDOT:PSS Conducting Polymer Nanospheres

“…In this case, we used Tap300Al-G probes by BudgetSensors. For obtaining quantitative mechanical maps and force spectra, the system was calibrated following recent literature reports [31][32][33], summarized in the following lines. First, we obtained the cantilevers' spring constant using Sader's method [34].…”

“May the Force Be with You!” Force–Volume Mapping with Atomic Force Microscopy

“…Natural diamond AFM probes with steel cantilevers were used for mapping indentation and elastic modulus of an epoxy molding compound using FVM, as reported by Germanicus et al A sample was prepared by incorporating silica beads in epoxy o -cresol novolac resins which are used as plastic packages for automotive, aerospace coatings, and integrated microelectronic devices. Indentation measurements acquired using SPM were compared to measurements acquired using Peak Force QNM at micrometer scales, in which the average values of contact modulus obtained by the two techniques were found to be comparable.…”

Fabrication and Nanoscale Properties of PEDOT:PSS Conducting Polymer Nanospheres

“…However, prior making further conclusions we must clarify that the geometry of polymer nanostructures might influence a proper quantification of mechanical properties by PF-QNM maps alone, as reported recently [53]. Also, problems as topography crosstalk and the influence of the sinusoidal excitation of the piezo scanner during mapping [54] might affect a precise quantification of mechanical properties by PF-QNM maps. Then, to confirm possible mechanical changes in the PEDOT:PSS nanospheres, and enhance the nanoscale mechanical characterization, we performed force spectroscopy measurements on selected regions of the samples.…”