“…Therefore, the parasitic current across the oxide can largely be eliminated by using the differential Ie subtraction method described in Section 3.2.3. It is clear from the current values above about 0.3 V forward bias that, when the leakage is subtracted, the Ie is practically the same for both diodes and close to the values for the LPCVD and Epsilon PureB diodes [133].…”
Section: B-deposition In the Ulpcvd Systemsupporting
confidence: 70%
“…The PureB diode I-V characteristics for the LPCVD and ULPCVD furnace depositions at 400℃ are shown in Fig. 5.12 (a) and (b), respectively [133]. The LPCVD results were measured across the wafer on 50 dies and were found to be very uniform with a JSE value 1.00 ± 0.05 × 10 -12 A/cm 2 that was identical to what was achieved with Epsilon PureB diodes.…”
Section: B-deposition In the Ulpcvd Systemmentioning
confidence: 66%
“…There was more spread in the corresponding Rsh values, the lowest of which were 35 kΩ/sq, just as for the comparable Epsilon PureB diodes, but several were in the 40 -50 kΩ/sq range and a couple as high as 75 kΩ/sq. Such higher values could indicate a small amount of native oxide contamination of the Si surface [133]. The I-V characteristics of the ULPCVD PureB diodes displayed a large spread in current, showing a nonideal leakage as seen in Fig.…”
Section: B-deposition In the Ulpcvd Systemmentioning
“…Therefore, the parasitic current across the oxide can largely be eliminated by using the differential Ie subtraction method described in Section 3.2.3. It is clear from the current values above about 0.3 V forward bias that, when the leakage is subtracted, the Ie is practically the same for both diodes and close to the values for the LPCVD and Epsilon PureB diodes [133].…”
Section: B-deposition In the Ulpcvd Systemsupporting
confidence: 70%
“…The PureB diode I-V characteristics for the LPCVD and ULPCVD furnace depositions at 400℃ are shown in Fig. 5.12 (a) and (b), respectively [133]. The LPCVD results were measured across the wafer on 50 dies and were found to be very uniform with a JSE value 1.00 ± 0.05 × 10 -12 A/cm 2 that was identical to what was achieved with Epsilon PureB diodes.…”
Section: B-deposition In the Ulpcvd Systemmentioning
confidence: 66%
“…There was more spread in the corresponding Rsh values, the lowest of which were 35 kΩ/sq, just as for the comparable Epsilon PureB diodes, but several were in the 40 -50 kΩ/sq range and a couple as high as 75 kΩ/sq. Such higher values could indicate a small amount of native oxide contamination of the Si surface [133]. The I-V characteristics of the ULPCVD PureB diodes displayed a large spread in current, showing a nonideal leakage as seen in Fig.…”
Section: B-deposition In the Ulpcvd Systemmentioning
“…The deposition parameters, which can vary over a wide range, include the pressure in the reaction chamber, the temperature of the wafer, the ow rate of the gas, the distance of the gas through the wafer, the chemical composition of the gas, the ratio of one gas to another, the role of the intermediate product of the reaction, and whether other reactions are needed. [124][125][126][127][128] Pumera et al 129 synthesized MoS 2 lms via powderless gas deposition. The CVD fabrication method they used is suitable for industry because this powderless and one-step process eliminates the deviations of MoS 2 growth which are likely to arise from the usage of a powder precursor.…”
In this review, we summarize three general classes of effective strategies to enhance the HER activity of MoS2 and DFT calculation methods, i.e. defect engineering, heterostructure formation, and heteroatom doping.
“…Results are therefore machine and material dependent. In fact, similar to the deposition techniques employed in this work to realize boron thin films, over the last decades for a variety of thin films/materials and/or deposition techniques investigations/characterizations/optimizations were performed by MESA + affiliated academic research groups [23][24][25][26][27][28][29][30][31][32][33][34][35][36][37][38][39]. This work is dedicated to research in the realization of boron thin films and focuses on typical film characteristics of films obtained with various deposition techniques.…”
Boron as thin film material is of relevance for use in modern micro- and nano-fabrication technology. In this research boron thin films are realized by a number of physical and chemical deposition methods, including magnetron sputtering, electron-beam evaporation, plasma enhanced chemical vapor deposition (CVD), thermal/non-plasma CVD, remote plasma CVD and atmospheric pressure CVD. Various physical, mechanical and chemical characteristics of these boron thin films are investigated, i.e., deposition rate, uniformity, roughness, stress, composition, defectivity and chemical resistance. Boron films realized by plasma enhanced chemical vapor deposition (PECVD) are found to be inert for conventional wet chemical etchants and have the lowest amount of defects, which makes this the best candidate to be integrated into the micro-fabrication processes. By varying the deposition parameters in the PECVD process, the influences of plasma power, pressure and precursor inflow on the deposition rate and intrinsic stress are further explored. Utilization of PECVD boron films as hard mask for wet etching is demonstrated by means of patterning followed by selective structuring of the silicon substrate, which shows that PECVD boron thin films can be successfully applied for micro-fabrication.
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