2012
DOI: 10.1134/s1063782612030256
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Pulsed laser deposition of ITO thin films and their characteristics

Abstract: The indium tin oxide (ITO) thin films are grown on quartz glass substrates by the pulsed laser dep osition method. The structural, electrical, and optical properties of ITO films are studied as a function of the substrate temperature, the oxygen pressure in the vacuum chamber, and the Sn concentration in the target. The transmittance of grown ITO films in the visible spectral region exceeds 85%. The minimum value of resistivity 1.79 × 10 -4 Ω cm has been achieved in the ITO films with content of Sn 5 at %.

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Cited by 26 publications
(12 citation statements)
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“…The shallow traps operate mostly at low temperatures, and the deeper traps are added at increasing temperature. These results are largely similar to those obtained in other studies. …”
Section: Nanoparticle Parameterssupporting
confidence: 92%
“…The shallow traps operate mostly at low temperatures, and the deeper traps are added at increasing temperature. These results are largely similar to those obtained in other studies. …”
Section: Nanoparticle Parameterssupporting
confidence: 92%
“…6 To improve the J sc of SHJ solar cells while maintaining high fill factor, it is necessary to explore and develop TCO films with better optical and electrical properties. In the past decades, the ITO films have been grown by several deposition techniques, including direct current (DC) or radiofrequency sputtering, 7,8 thermal evaporation and electron beam evaporation, 9,10 plasma-enhanced reactive thermal evaporation, 11,12 pulsed laser deposition, 13,14 and reactive plasma deposition. 15 Among them, the sputtering process is currently the most widely used technique to deposit ITO films in mass production.…”
mentioning
confidence: 99%
“…Let us consider a semiconductor with a high concentration of conduction electrons, such as In 2 O 3 , where donors are the oxygen vacancies introduced to the material upon its synthesis and processing. Although the electron binding energy ε d of a single oxygen vacancy donor is unknown, the estimate of ε d can be obtained by using the experimental temperature dependence of the conductivity of a bulk sample of In 2 O 3 measured in refs and . This is because the conductivity of the semiconductor is approximately proportional to the concentration of conduction electrons n c ∼ exp­{−ε d /2 kT }. , The estimates based on the conductivity of bulk In 2 O 3 give ε d ≈ 0.2 eV, which is approximately the same as the value obtained using conductivity measurements for the nanostructured In 2 O 3 film sample in vacuum, i.e.…”
Section: Equilibrium Distribution Of the Charges Inside Spherical Nan...mentioning
confidence: 61%