2017
DOI: 10.1016/j.apsusc.2016.08.125
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Properties of TiO 2 thin films deposited by rf reactive magnetron sputtering on biased substrates

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Cited by 82 publications
(43 citation statements)
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“…In this work, we successfully deposited crystalline, homogeneous, rutile TiO 2 thin films with smooth surfaces by RF MS at RT, without any induced substrate bias and in a continuous gas flow. Nezar et al [26] similarly did not use any substrate bias or heating and they obtained predominantly anatase TiO 2 . This is easily explained by the fact that we used more RF power, which increased our sputtering yield, and a considerably higher vacuum, which increased the mean free path of our atoms/ions.…”
Section: Resultsmentioning
confidence: 99%
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“…In this work, we successfully deposited crystalline, homogeneous, rutile TiO 2 thin films with smooth surfaces by RF MS at RT, without any induced substrate bias and in a continuous gas flow. Nezar et al [26] similarly did not use any substrate bias or heating and they obtained predominantly anatase TiO 2 . This is easily explained by the fact that we used more RF power, which increased our sputtering yield, and a considerably higher vacuum, which increased the mean free path of our atoms/ions.…”
Section: Resultsmentioning
confidence: 99%
“…Crystalline TiO 2 (anatase, rutile or a mixture of both) was obtained either by controlling the O 2 flow and sputtering pressure [36,37], by applying a substrate bias voltage [3,17,38], or by annealing [39][40][41]. Nezar et al [26] managed to obtain crystalline TiO 2 by reactive magnetron sputtering without applying any substrate bias at RT, with predominantly anatase phase ( Table 4). The reason for obtaining anatase TiO 2 , as is the case for annealing amorphous TiO 2 [39][40][41], is that it requires less energy to form than the rutile phase.…”
Section: Discussionmentioning
confidence: 99%
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“…With exception of sample S5, the spectra reveals small peaks at 25° e 55° associated to anatase phase of TiO 2 , and at 27° associated to rutile phase of TiO 2 , as well as peaks associated to iron, main material of substrate [12][13][14] . Sample S5 presented only the pronounced peak associated to the substrate, and a broad peak for the thin film, that was associated to the formation of amorphous titanium oxide 15 .…”
Section: Resultsmentioning
confidence: 99%
“…The spectra were identified using databases of Crystallography Open Database (COD), International Centre for Diffraction Data (ICDD), and published papers [12][13][14] . In order to investigate topography of surfaces and roughness, a Confocal Microscope, Leica DCM 3D, was employed.…”
Section: Methodsmentioning
confidence: 99%