Process integration, improvements, and testing of Si interposers for embedded computing applications

Goodwin, Scott; Lannon, John; Hilton, Allan; Huffman, Alan; Lueck, Matthew; Vick, Erik; Cunningham, G.; Malta, Dean; Gregory, Christopher; Temple, Dorota

doi:10.1109/ectc.2014.6897259

2014 IEEE 64th Electronic Components and Technology Conference (ECTC) 2014

DOI: 10.1109/ectc.2014.6897259

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Process integration, improvements, and testing of Si interposers for embedded computing applications

Scott Goodwin

John Lannon

Allan Hilton

et al.

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Process integration, improvements, and testing of Si interposers for embedded computing applications

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