1993
DOI: 10.1049/el:19931175
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Process characterisation with dynamic test structures

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Cited by 7 publications
(5 citation statements)
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“…For the current expressions we use the standard Shichman and Hodges model, which appears to be sufficient for average calculations, short channel effects being later introduced through calibration coefficients on the effective mobility length ratio as discussed in [16]. After some tedious but not complicated calculations, equ.…”
Section: Short Circuit Power Evaluationmentioning
confidence: 99%
“…For the current expressions we use the standard Shichman and Hodges model, which appears to be sufficient for average calculations, short channel effects being later introduced through calibration coefficients on the effective mobility length ratio as discussed in [16]. After some tedious but not complicated calculations, equ.…”
Section: Short Circuit Power Evaluationmentioning
confidence: 99%
“…2), represent speed characteristic parameters of the considered process, and are defined through average values of mobilities and transistor lengths across the full voltage excursion. Their values can be extracted directly from the characterization of specific oscillators or calibrated from simulation of inverters [20].…”
Section: Inv1 Inv2mentioning
confidence: 99%
“…15), µ eff (equ. 7,8)and τ st and R(µ) (equ. 6), is quite good and validates the low voltage corrections proposed here.…”
Section: Low Voltage Input Slope Effectsmentioning
confidence: 99%
“…µ eff correspond to the average effective mobility over the voltage swing, including saturation effects. As shown in [8], these parameters can be obtained directly from calibrations on SPICE simulations (using foundry supplied level 6 model, for ex.) or determined directly from specific test structures implemented on ring oscillators.…”
Section: Low Voltage Modelling Of Step Responsesmentioning
confidence: 99%
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