2015
DOI: 10.1016/j.micromeso.2015.05.050
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Probing the microporosity of low-k organosilica films: MP and t-plot methods applied to ellipsometric porosimetry data

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Cited by 12 publications
(6 citation statements)
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“…We also observed this specific behavior of toluene for EP experiments performed on microporous organosilica thin films prepared by plasma enhanced vapor deposition …”
Section: Hierarchically Porous Organosilica Membranessupporting
confidence: 57%
“…We also observed this specific behavior of toluene for EP experiments performed on microporous organosilica thin films prepared by plasma enhanced vapor deposition …”
Section: Hierarchically Porous Organosilica Membranessupporting
confidence: 57%
“…Ellipsometric porosimetry (EP) is a powerful technique for the evaluation of thin porous films. It is based on in-situ ellipsometry monitoring of the refractive index changes in the porous layer as a result of the adsorption/desorption of a probe molecule supplied at well-controlled partial pressures 5153 . For a qualitative assessment of the resulting isotherms, one can avoid fitting the recorded Psi/Delta values by plotting the relative changes of these optical parameters as a function of adsorbate pressure (e.g., Delta at 633 nm) (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…In this study, the Harkins–Jula standard t -curve (eq ) was used as the standard isotherm . This curve is one of the commonly used t -curves for the MP method . Further details are described in the Experimental Procedure S1, Supporting Information.…”
Section: Methodsmentioning
confidence: 99%