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2020
DOI: 10.1166/sam.2020.3650
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Prism-Based Laser Interference Lithography System for Simple Multibeam Interference Lithography

Abstract: Laser interference lithography is a powerful technique of subwavelength-scale patterning. However, this technique requires a complicated optical system, the precise control and complexity of which increases exponentially with increasing number of beams. In this study, a compact prism-based laser interference lithography system using optical fibers and a prism was proposed to simplify the technique. In this system, the beam splitter and mirrors in a typical laser interference lithography system were replaced b… Show more

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Cited by 5 publications
(8 citation statements)
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“…The results of the simulations match those calculated using Equation ( 2), and Λ was found to be close to the theoretical values, with 1396.3 and 1167.2 nm for the UV-fused silica and N-BK7 prisms, respectively. Although our setup in this study included a different convex lens from that used in our previous study [44], the change in the pitch of the interference pattern owing to the convex lens was negligible, and Equation ( 2) Figure 6a shows two strong peaks corresponding to Cu 2p 1/2 and 2p 3/2 and two weak Cu 2+ peaks. The XPS data show that the sample fabricated at a scan speed of 17 mm/s contains fewer copper oxides than that fabricated at 5 mm/s, as a large number of copper oxide peaks are observed in the XPS profile of the latter (Figure 6b).…”
Section: Resultsmentioning
confidence: 98%
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“…The results of the simulations match those calculated using Equation ( 2), and Λ was found to be close to the theoretical values, with 1396.3 and 1167.2 nm for the UV-fused silica and N-BK7 prisms, respectively. Although our setup in this study included a different convex lens from that used in our previous study [44], the change in the pitch of the interference pattern owing to the convex lens was negligible, and Equation ( 2) Figure 6a shows two strong peaks corresponding to Cu 2p 1/2 and 2p 3/2 and two weak Cu 2+ peaks. The XPS data show that the sample fabricated at a scan speed of 17 mm/s contains fewer copper oxides than that fabricated at 5 mm/s, as a large number of copper oxide peaks are observed in the XPS profile of the latter (Figure 6b).…”
Section: Resultsmentioning
confidence: 98%
“…The results of the simulations match those calculated using Equation (2), and Λ was found to be close to the theoretical values, with 1396.3 and 1167.2 nm for the UV-fused silica and N-BK7 prisms, respectively. Although our setup in this study included a different convex lens from that used in our previous study [44], the change in the pitch of the interference pattern owing to the convex lens was negligible, and Equation ( 2) remained valid even though the beam was not collimated. Figure 6a shows two strong peaks corresponding to Cu 2p1/2 and 2p3/2 and two weak Cu 2+ peaks.…”
Section: Resultsmentioning
confidence: 99%
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“…In recent years, nanotechnology has developed rapidly with a focus on developing cost-effective methods for the fabrication of nanoscale patterns for large areas [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20]. Nanoimprint lithography (NIL) is a low-cost and largearea processing method for fabricating nanopatterns.…”
Section: Introductionmentioning
confidence: 99%