2000
DOI: 10.1116/1.1319710
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PREVAIL: Dynamic correction of aberrations

Abstract: Electron optical image correction subsystem in electron beam projection lithographyLie algebraic aberration theory and calculation method for combined electron beam focusing-deflection systems

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Cited by 5 publications
(1 citation statement)
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“…A complete listing of third-order distortion aberrations is shown in Table I, according to the nomenclature of Munro 13 for a projection or shaped beam system. 8 To experimentally determine the sensitivity of the subfield shape with the excitation of the dynamic correction elements, we exposed a single subfield consisting of a regular array of 9 ϫ 9 L-shaped features ͑L patterns͒. Also shown in the table are the methods or means for correcting or mitigating each of the distortion aberrations.…”
Section: Distortion Aberrations and Dynamic Correction Adjustmentmentioning
confidence: 99%
“…A complete listing of third-order distortion aberrations is shown in Table I, according to the nomenclature of Munro 13 for a projection or shaped beam system. 8 To experimentally determine the sensitivity of the subfield shape with the excitation of the dynamic correction elements, we exposed a single subfield consisting of a regular array of 9 ϫ 9 L-shaped features ͑L patterns͒. Also shown in the table are the methods or means for correcting or mitigating each of the distortion aberrations.…”
Section: Distortion Aberrations and Dynamic Correction Adjustmentmentioning
confidence: 99%