“…The low free carrier concentration and high resistivity of undoped SI LEC bulk GaAs are achieved by the compensation of residual shallow acceptor impurities (usually carbon) with the native deep donor defect denoted EL2 [37,38]. We believe that the detector active region width is determined by the concentration of ionized deep dopants and shallow dopants [17,[39][40][41]. A simple model in which one type of shallow acceptor, deep acceptor, shallow donor, and deep donor are present in the band gap gives…”