2007
DOI: 10.1007/s10853-006-1405-9
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Preparation and characterization of metalorganic chemical vapor deposited nickel oxide and lithium nickel oxide thin films

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Cited by 16 publications
(9 citation statements)
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“…The spectrum indicates a good fit and using DataFurnace Code (Jeynes et al, 2003), the ratio of Li:Cr:O was estimated to be 36:18:46 leading to stoichiometry of Li 2 CrO 2+δ (δ = 0.5) . It was also observed that the ratio of Li:Cr in the thin films confirmed our earlier reports on vanadium cobalt oxide systems (Adedeji, Egharevba, Jeynes, & Ajayi, 2002) and lithium nickel oxide (Eleruja et al, 2007) that the Li:Cr ratio in the precursor is different from that in the film. In our earlier reports, we attributed this difference to the possible reconstitution of the structure and bonds at the formation stage of the films.…”
Section: Compositional Studysupporting
confidence: 88%
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“…The spectrum indicates a good fit and using DataFurnace Code (Jeynes et al, 2003), the ratio of Li:Cr:O was estimated to be 36:18:46 leading to stoichiometry of Li 2 CrO 2+δ (δ = 0.5) . It was also observed that the ratio of Li:Cr in the thin films confirmed our earlier reports on vanadium cobalt oxide systems (Adedeji, Egharevba, Jeynes, & Ajayi, 2002) and lithium nickel oxide (Eleruja et al, 2007) that the Li:Cr ratio in the precursor is different from that in the film. In our earlier reports, we attributed this difference to the possible reconstitution of the structure and bonds at the formation stage of the films.…”
Section: Compositional Studysupporting
confidence: 88%
“…The profile shows that there is diffusion of some materials across the film-substrate interface. This feature had been observed in many thin film systems (Eleruja et al, 2007;Ajayi, Akanni, Lambi, Jeynes, & Watts, 1990), where different elements migrated from the substrates to the films.…”
Section: Compositional Studymentioning
confidence: 64%
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“…It was also observed that the ratio of Li : Mn in the precursor is different from that of the film. Such difference has been observed in some of our works on mixed metal oxides produced from mechanical mixing of precursors [22][23][24]. This difference can be attributed to a possible breakdown of the metal-metal bond of the precursor in the vapour phase at the deposition temperature and subsequent reconstitution of the bonds leading to a different stoichiometry of the film.…”
mentioning
confidence: 54%
“…Our simple set up has been used in the past to produce good quality thin films that have shown excellent properties. In this study, we report the [22][23][24]. The results of the investigations of some of the basic properties of the deposited thin films are also presented.…”
Section: Introductionmentioning
confidence: 99%