2014
DOI: 10.1088/1742-6596/480/1/012007
|View full text |Cite
|
Sign up to set email alerts
|

Preparation and characterization of Cu2ZnSnSe4thin films grown from ZnSe and Cu2SnS3precursors in a two stage process

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2015
2015
2019
2019

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(3 citation statements)
references
References 8 publications
0
3
0
Order By: Relevance
“…Thus, the work function mapping analysis indicates that the ZnSe‐related phases appear near the grain boundaries of the CZTSSe layer, and these observations correspond to the findings reported in previous studies, as shown in Figure (b). Large ZnSe phases accumulate on the front of the absorber layer, resulting in a detrimental effect on the performance of the device, especially for J SC and the FF . The ZnSe phase accumulated on the surface when the ZnS conditions were not the optimum, and the presence of the ZnSe phase accumulated on the back spot of the absorber layer for the optimized ZnS condition, as shown in Figure (b).…”
Section: Resultsmentioning
confidence: 97%
See 1 more Smart Citation
“…Thus, the work function mapping analysis indicates that the ZnSe‐related phases appear near the grain boundaries of the CZTSSe layer, and these observations correspond to the findings reported in previous studies, as shown in Figure (b). Large ZnSe phases accumulate on the front of the absorber layer, resulting in a detrimental effect on the performance of the device, especially for J SC and the FF . The ZnSe phase accumulated on the surface when the ZnS conditions were not the optimum, and the presence of the ZnSe phase accumulated on the back spot of the absorber layer for the optimized ZnS condition, as shown in Figure (b).…”
Section: Resultsmentioning
confidence: 97%
“…Ar gas was then introduced into the sealed furnace, and the pressure increased to atmospheric pressure. The final thickness of the absorbers was 1.2 µm, and the detailed formation of the phases involves Cu 2 SnSe 3 and ZnS combining into Cu 2 ZnSn(S,Se) 4 . The CZTSSe absorber layers were covered with a 50‐nm‐thick CdS buffer layer through a chemical bath deposition.…”
Section: Methodsmentioning
confidence: 99%
“…On the contrary, the transmittance reached 60 % after annealing. This seems to be due to the improvement of crystalline quality of the Cu 2 SnS 3 phase [20]. The transmittance decreases smoothly by decreasing of the wavelength.…”
Section: S-rich Conditions the Neighboring Compound Of Cu 2 Sns 3 Inmentioning
confidence: 90%