2013
DOI: 10.1063/1.4802353
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Preliminary study on development of 300 Kv compact focused gaseous ion beam system

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Cited by 5 publications
(3 citation statements)
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“…Ohkubo et al [89] developed a compact system at the Japan Atomic Energy Agency (JAEA) for various gaseous ion beams capable of reaching 300 keV. Ohkubo et al [89] developed a compact system at the Japan Atomic Energy Agency (JAEA) for various gaseous ion beams capable of reaching 300 keV.…”
Section: Ion Beam Lithographymentioning
confidence: 99%
“…Ohkubo et al [89] developed a compact system at the Japan Atomic Energy Agency (JAEA) for various gaseous ion beams capable of reaching 300 keV. Ohkubo et al [89] developed a compact system at the Japan Atomic Energy Agency (JAEA) for various gaseous ion beams capable of reaching 300 keV.…”
Section: Ion Beam Lithographymentioning
confidence: 99%
“…The beam diameter in full width at half maximum (FWHM) was calculated by fitting of the error function to the beam current as a function of the knife-edge position. 7 The beam current was approximately 3 pA with the stability of 10% for the all kinetic energy. The beam current condition was maintained unless the electric breakdown occurred.…”
mentioning
confidence: 99%
“…Because the ions move in the vicinity of the optical axis in cylindrical coordinates, the ions accordingly behave in the paraxial approximation described as the paraxial ray equation. 7 Then, the focal length for a pair of electrodes f is described as where L is the distance between the electrodes. The focal length is invariable when the acceleration ratio is kept constant, which is the key characteristic of the gas-FIB system leading to the expectation of its use as a powerful tool for 3D PBW.…”
mentioning
confidence: 99%