A compact focused gaseous ion beam system has been developed to form proton microbeams of a few hundreds of keV with a penetration depth of micrometer range in 3-dimensional proton beam writing. Proton microbeams with kinetic energies of 100-140 keV were experimentally formed on the same point at a constant ratio of the kinetic energy of the object side to that of the image side. The experimental results indicate that the beam diameters were measured to be almost constant at approximately 6 µm at the same point with the kinetic energy range. These characteristics of the system were experimentally and numerically demonstrated to be maintained as long as the ratio was constant. C 2015 AIP Publishing LLC. [http://dx.Ion microbeams from several hundreds of keV to several MeV have been applied for micro and nanofabrications. Proton microbeams in a few MeV range are especially used for microfabrications using photo-resists in proton beam writing (PBW). 1-6 A proton beam has a longer penetration depth than an electron beam with the same kinetic energy because of the highly straight penetration into materials on the low struggling effect. In addition, the penetration depth of the proton beam can be controlled by changing its kinetic energy. Because a proton microbeam with a kinetic energy of approximately 1 MeV has a penetration depth of micrometer range, 7,8 a 3-dimensional (3D) structure with a high aspect ratio can be made by beam writing directly using different kinetic energies of proton beams for a sample in 3D PBW. 4-6 Although 3D PBW is a promising tool for microfabrications in various small laboratories, the microbeams are presently formed using a long, large microbeam lens system in a large facility. In addition, when the kinetic energy of the microbeam is changed to another energy for the 3D PBW, more than one hour is required to obtain the same beam diameter by adjusting many parameters in the lens system (e.g., quadrupole magnets). To use the proton microbeam widely for 3D PBW applications, a compact system in keV range, namely, a focused gaseous ion beam (gas-FIB), has been developed at Japan Atomic Energy Agency (JAEA). 9,10 The gas-FIB system has a plasma ion source using hydrogen gas to generate a proton beam and is composed of a series of two electrostatic lenses, called the "acceleration lens system," each of which is a pair of disk-shaped electrodes with a small center hole (hereinafter referred to as acceleration lens). 10 The acceleration lens system has an extraction stage and a few acceleration stages. In each acceleration lens, the ion beam is strongly focused and weakly defocused around the objectside electrode and the image-side electrode, respectively. 11 Demagnification of an acceleration lens M is described by the following equation: a) Electronic mail: ohkubo.takeru@jaea.go.jp.where θ ob and θ im are halves of the beam divergence angles, and ε ob and ε im are the kinetic energies for the object and image sides, respectively. Here, (ε im /ε ob ) is defined as the acceleration ratio. The dema...