2004
DOI: 10.1016/j.matchemphys.2003.12.011
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Predicted electronic properties of GaAs under hydrostatic pressure

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Cited by 51 publications
(10 citation statements)
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“…It was proposed that the formation of a pressure induced quantum dot under the tip could enhance electron-hole recombination, with the energy emitted in the form of phonons or photons. 9,10 In contrast to silicon pn junction experiments, 9,10 for GaAs, the conduction band edge moves up in energy under hydrostatic pressures, 44,45 leading to repulsion of the electrons away from the tip-sample contact region. This decreases the effect of the electron-hole pair recombination rate and is inconsistent with our observation of increasing excess friction versus applied load ͓Fig.…”
Section: Discussionmentioning
confidence: 92%
“…It was proposed that the formation of a pressure induced quantum dot under the tip could enhance electron-hole recombination, with the energy emitted in the form of phonons or photons. 9,10 In contrast to silicon pn junction experiments, 9,10 for GaAs, the conduction band edge moves up in energy under hydrostatic pressures, 44,45 leading to repulsion of the electrons away from the tip-sample contact region. This decreases the effect of the electron-hole pair recombination rate and is inconsistent with our observation of increasing excess friction versus applied load ͓Fig.…”
Section: Discussionmentioning
confidence: 92%
“…and 204 K c = [7]. Moreover, the pressure-and temperature-dependent effective masses e * ( ) m P T , , * ( ) hh m P T , and hh * ( ) m P T , for electrons and heavy-holes, respectively, used in our theoretical calculations are given by [7,17,18] 1 e P 0 g g 0…”
Section: Original Papermentioning
confidence: 99%
“…where r is the carrier-impurity distance, ε(P) and m*(P) are the pressure-dependent static dielectric constant and electron (or hole) effective mass [5][6][7], θ is the electric field angle relative to the x-axis, and V(P, x, y) is the potential barrier that confines the carrier in the wire region which is considered as zero within the wire region and…”
Section: Theoretical Frameworkmentioning
confidence: 99%