Plastic deformation in SiO2 induced by heavy-ion irradiation

Benyagoub, A.; Löffler, Stefan; Rammensee, M.; Klaumünzer, S.; Saemann‐Ischenko, G.

doi:10.1016/0168-583x(92)95039-t

Cited by 87 publications

(73 citation statements)

References 14 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…We propose that ion irradiation generates biaxial compressive stress in silicon nitride, as it is known to do in other amorphous materials at higher ion energies. 2,3,[9][10][11][12][13][14][15][16][17][18] An analysis of the resulting mechanics provides good agreement with experimentally measured deflection profiles, as well as an explanation for the qualitatively different shapes observed in low-stress and high-stress silicon nitrides.…”

Section: Introductionmentioning

confidence: 58%

See 1 more Smart Citation

Focused ion beam induced deflections of freestanding thin films

Kim

Chen

Aziz

et al. 2006

Journal of Applied Physics

View full text Add to dashboard Cite

Prominent deflections are shown to occur in freestanding silicon nitride thin membranes when exposed to a 50 keV gallium focused ion beam for ion doses between 10 14 and 10 17 ions/ cm 2 . Atomic force microscope topographs were used to quantify elevations on the irradiated side and corresponding depressions of comparable magnitude on the back side, thus indicating that what at first appeared to be protrusions are actually the result of membrane deflections. The shape in high-stress silicon nitride is remarkably flat-topped and differs from that in low-stress silicon nitride. Ion beam induced biaxial compressive stress generation, which is a known deformation mechanism for other amorphous materials at higher ion energies, is hypothesized to be the origin of the deflection. A continuum mechanical model based on this assumption convincingly reproduces the profiles for both low-stress and high-stress membranes and provides a family of unusual shapes that can be created by deflection of freestanding thin films under beam irradiation.

show abstract

Section: Introductionmentioning

confidence: 58%

“…From extrapolating data taken at high energy, it appeared that anisotropic deformation does not occur below about 1 MeV. 17,18 Recently, however, colloidal SiO 2 par-FIG. 1.…”

Section: A Simple Mechanical Model For the Membrane Deflectionmentioning

confidence: 99%

Focused ion beam induced deflections of freestanding thin films

Kim

Chen

Aziz

et al. 2006

Journal of Applied Physics

View full text Add to dashboard Cite

show abstract

“…A stress-driven deformation of the SiO 2 matrix due to SHII-induced in-plane strain perpendicular to the ion beam direction has also been suggested as a potential elongation mechanism [107]. The latter leads to the well known "ion hammering" effect [108,109] causing the anisotropic expansion of both bulk SiO 2 [95,110] and colloidal SiO 2 [111,112] perpendicular to the incident beam. The lack of NP elongation in the absence of a sufficiently thick surrounding matrix, as shown by Penninkhof et al [113], supports this theory.…”

Section: Introductionmentioning

confidence: 99%

Ion Beam Formation and Modification of Cobalt Nanoparticles

Sprouster

Ridgway

2012

Applied Sciences

View full text Add to dashboard Cite

This article reviews the size-dependent structural properties of ion beam synthesized Co nanoparticles (NPs) and the influence of ion irradiation on the size, shape, phase and structure. The evolution of the aforementioned properties were determined using complementary laboratory-and advanced synchrotron-based techniques, including cross-sectional transmission electron microscopy, small-angle X-ray scattering and X-ray absorption spectroscopy. Combining such techniques reveals a rich array of transformations particular to Co NPs. This methodology highlights the effectiveness of ion implantation and ion irradiation procedures as a means of fine tuning NP properties to best suit specific technological applications. Furthermore, our results facilitate a better understanding and aid in identifying the underlying physics particular to this potentially technologically important class of nanomaterials.

show abstract

“…The anisotropic deformation is most pronounced at low temperatures ͑Ͻ100 K͒ and decreases with increasing irradiation temperature. 4,7 The deformation increases with ion fluence at a constant rate, without saturation. It is well established that the deformation is mainly driven by electronic excitations rather than the atomic displacements induced by the ion beam.…”

Section: Introductionmentioning

confidence: 99%

“…[1][2][3][4][5][6][7] The anisotropy is related to the direction of the ion beam: materials expand perpendicular to the ion beam and contract parallel to the ion beam while maintaining their volume. The anisotropic deformation is most pronounced at low temperatures ͑Ͻ100 K͒ and decreases with increasing irradiation temperature.…”

Section: Introductionmentioning

confidence: 99%