1996
DOI: 10.1007/bf01570179
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Plasma and beam facility atomic oxygen erosion of a transition metal complex

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Cited by 9 publications
(9 citation statements)
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“…A pristine sapphire disk was located adjacent to a film of organically-wrapped zirconium coordination complex, bis(N,N 1disalicylidene-1,2-phenylenediaminato)zirconium(IV), Zr(dsp) 2 , on glass in an oxygen beam facility. Following AO exposure, X-ray photoelectron spectroscopy (XPS) confirmed that the complex was being transformed into zirconium dioxide without deposition of volatile zirconium-containing contaminants onto the sapphire [14]. However, one limitation was encountered.…”
Section: Introductionmentioning
confidence: 99%
“…A pristine sapphire disk was located adjacent to a film of organically-wrapped zirconium coordination complex, bis(N,N 1disalicylidene-1,2-phenylenediaminato)zirconium(IV), Zr(dsp) 2 , on glass in an oxygen beam facility. Following AO exposure, X-ray photoelectron spectroscopy (XPS) confirmed that the complex was being transformed into zirconium dioxide without deposition of volatile zirconium-containing contaminants onto the sapphire [14]. However, one limitation was encountered.…”
Section: Introductionmentioning
confidence: 99%
“…Incorporation of zirconium-containing components onto PI matrices is being investigated as a means to enhance their AO resistance and extend performance lifetime in LEO. We contend that in situ formation of zirconium dioxide upon AO exposure, as previously demonstrated [47], will provide superior protection to underlying polymer than AO protective coatings. Such coatings invariably have surface manufacturing defects which allows AO undercutting to occur at these locations [45,48] and have no self-repairing capability if compromised by impact.…”
Section: Introductionmentioning
confidence: 68%
“…Use of a polysiloxane-PI blend to generate a protective silicon oxide layer in LEO caused a volatile contaminant to be deposited on adjacent surfaces [49]. This problem was not observed upon ground-based AO exposure of the Zr-containing component being used here [47].…”
Section: Introductionmentioning
confidence: 94%
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“…Wet films were then cast and thermally imidized 50. The in situ generation of a protective metal oxide layer upon land‐based AO exposure was considered proof of concept 50, 51. However, a significant decrease in film quality was observed even at relatively low additive concentrations.…”
Section: Introductionmentioning
confidence: 99%