1997
DOI: 10.1109/92.585214
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Pipelined H-trees for high-speed clocking of large integrated systems in presence of process variations

Abstract: This paper addresses the problem of clocking large high-speed digital systems, as well as deterministic skew modeling, a related problem. A conventional method for clocking a large digital system is to use a set of metallic lines organized as a tree. This method is limited by the bandwidth of the clock network. Another limitation of existing solutions is that available skew models do not directly take into account process variations. In order to provide a reliable skew model, and to avoid the frequency limitat… Show more

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Cited by 28 publications
(10 citation statements)
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(26 reference statements)
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“…As well in [3], VanScheik et al discuss asynchronously connecting systems. We use an approach much like in [4] by Nekili et. al.…”
Section: B System and Design Requirementsmentioning
confidence: 99%
“…As well in [3], VanScheik et al discuss asynchronously connecting systems. We use an approach much like in [4] by Nekili et. al.…”
Section: B System and Design Requirementsmentioning
confidence: 99%
“…In order to satisfy such tight timing constraints, the clock signal is required to arrive at precisely the same time at every register on a chip. To achieve equal-delay distribution of the clock signal across a die, symmetric hierarchical structures such as H-trees are utilized, especially in the higher levels of a clock distribution network [2][3][4].…”
Section: Introductionmentioning
confidence: 99%
“…Xi and Dai [3] considered only global process variations (fast and slow corner combinations for PMOS and NMOS devices) and used global derating factors, thus ignoring the effect of local variations. Finally, authors in [6] included the effect of intrachip, long-range gradient variations in an analytical model of the skew of a pipelined H-tree. As the information regarding the individual position and orientation of a chip on the wafer is lost after wafer dicing, the model derived in [6] may be difficult to apply in practice.…”
Section: Introductionmentioning
confidence: 99%
“…Finally, authors in [6] included the effect of intrachip, long-range gradient variations in an analytical model of the skew of a pipelined H-tree. As the information regarding the individual position and orientation of a chip on the wafer is lost after wafer dicing, the model derived in [6] may be difficult to apply in practice. Moreover, it is shown in this paper that the usually neglected component of mismatch that is proportional to the inverse of the channel area tends to dominate in DSM technologies.…”
Section: Introductionmentioning
confidence: 99%