2008
DOI: 10.1016/j.sna.2008.07.021
|View full text |Cite
|
Sign up to set email alerts
|

Piezoelectric thin films for MEMS applications—A comparative study of PZT, 0.7PMN–0.3PT and 0.9PMN–0.1PT thin films grown on Si by r.f. magnetron sputtering

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
11
0
2

Year Published

2010
2010
2018
2018

Publication Types

Select...
5
2
1

Relationship

0
8

Authors

Journals

citations
Cited by 33 publications
(14 citation statements)
references
References 23 publications
1
11
0
2
Order By: Relevance
“…It had been proven to be promising materials for high-k capacitors, actuators and non-linear optical devices [4,5]. Various techniques, such as rf magnetron sputtering [6], pulsed laser deposition [7,8], sol-gel [9][10][11] and metalorganic chemical vapor deposition [12], have been used to obtain the PMN-PT film on different substrates.…”
Section: Introductionmentioning
confidence: 99%
“…It had been proven to be promising materials for high-k capacitors, actuators and non-linear optical devices [4,5]. Various techniques, such as rf magnetron sputtering [6], pulsed laser deposition [7,8], sol-gel [9][10][11] and metalorganic chemical vapor deposition [12], have been used to obtain the PMN-PT film on different substrates.…”
Section: Introductionmentioning
confidence: 99%
“…PVDF-based relaxors possess a weak dependence of dielectric permittivity on electric field, i.e., a ≈ 0. Values of a for other compounds were estimated by fitting the values of ε(E) for BZT25 and BZT30 [17], 0.7PMN-0.3PT [21], 0.91PMN-0.09PT and PMN [19], and PLZT8/85/15 [22] to Eq. (13).…”
Section: Electrocaloric Relaxor Materialsmentioning
confidence: 99%
“…The fi lm composition is fi xed to Zr:Ti = 54:46 near the so-called morphotropic phase boundary where the piezoelectric activity is larger. To crystallize the PZT fi lm in perovskite phase, a conventional post-annealing treatment at 625 °C in air during 30 min was required [ 37 ]. The fi lm thickness was ranging from 100 to 300 nm depending on the island diameter.…”
Section: Thin Film Structurementioning
confidence: 99%