2016
DOI: 10.1007/s10854-016-5821-6
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Physical properties of SnO2 thin films prepared by isothermal oxidation of vacuum evaporated Sn

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Cited by 4 publications
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“…The increase in crystallite size between 800 to 1000°C could contribute to stress relaxation. 20) By comparing the inset scanning electron microscope (SEM) images with optical microscope (OM) images (Fig. 4), it can be seen that the size of the aggregated particles on the SnO 2 thin film surface apparently decreased with the increase in annealing temperature up to 1000°C.…”
Section: Resultsmentioning
confidence: 99%
“…The increase in crystallite size between 800 to 1000°C could contribute to stress relaxation. 20) By comparing the inset scanning electron microscope (SEM) images with optical microscope (OM) images (Fig. 4), it can be seen that the size of the aggregated particles on the SnO 2 thin film surface apparently decreased with the increase in annealing temperature up to 1000°C.…”
Section: Resultsmentioning
confidence: 99%