2020
DOI: 10.1016/j.solidstatesciences.2020.106147
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Physical characterization of CuO thin films obtained by thermal oxidation of vacuum evaporated Cu

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Cited by 23 publications
(9 citation statements)
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“…The standard values of lattice parameters are, ɑ = 3b) and are in good compliance with those reported in the literature. 31,32 Figure 3b shows that the lattice parameters a is inversely related with c. As a function of film thickness, when parameter a increases the parameter c decreases, and vice-versa. This may occur due to the strain value is significantly lower because of the residual stress in the deposited films.…”
Section: =mentioning
confidence: 99%
“…The standard values of lattice parameters are, ɑ = 3b) and are in good compliance with those reported in the literature. 31,32 Figure 3b shows that the lattice parameters a is inversely related with c. As a function of film thickness, when parameter a increases the parameter c decreases, and vice-versa. This may occur due to the strain value is significantly lower because of the residual stress in the deposited films.…”
Section: =mentioning
confidence: 99%
“…Oxidation is accomplished by annealing in an air atmosphere inside a tubular furnace [ 34 , 35 ]. CuO was grown on glass substrates using the above procedure [ 36 ]. NiO thin films were grown using thermal oxidation, and Ni metal was deposited using magnetron sputtering on quartz substrates at ambient conditions [ 37 ].…”
Section: Synthesis Of P-type Mox Thin Filmsmentioning
confidence: 99%
“…Another often overlooked factor is the oxidation time. Indeed, this factor could affect the crystallinity of thin films [ 36 ].…”
Section: Synthesis Of P-type Mox Thin Filmsmentioning
confidence: 99%
“…La Tabla 1 resume los valores obtenidos para cada set de muestras TT-B, TT-C y TT-D. Tal como puede apreciarse en la Figura 3b, y considerando la barra de incertidumbre de cada valor, se encuentra que dicho valor permanece constante y es independiente del tratamiento térmico aplicado en este rango de temperaturas y tiempos, mostrando que aplicar 400 °C en los rangos de tiempos trabajados, no modifica el tamaño del cristalito; esto acorde a otros trabajos reportados en la literatura para rangos de temperatura por debajo de 400 °C (31)(32)(33) .…”
Section: Figura 2 Patrones De Difracción De Rayos X Para La Muestra P...unclassified