The model of electroluminescence in forward‐biased MS and MIS light‐emitting diodes based on the Auger recombination on the contact surface of the semiconductor is developed. Such a model may provide a light emission with the threshold voltage Uth = (Eg/2e) – (Efs/2e) < hνmax/e or even Uth = (hνmax/2e) – (Efs/e), depending on the physical processes involved. Here Eg, is the energy gap of the semiconductor, Efs the Fermi energy level in the semiconductor with respect to the c‐band edge, hνmax the maximum of the electroluminescence band, e the electron charge. Experimental results obtained on ZnS MS and MIS diodes essential for this model are presented and analysed. It is found that the spectral distribution of diode emission remains practically unchanged at biases close to the threshold voltage Uth. The conclusion is drawn that the electroluminescence and the forward current have typical tunnel characteristics even in the case of ZnS MIS diodes with i‐layers several thousand angstroms thick. The main physical properties of zinc chalcogenide light‐emitting diodes are explained by means of the model developed.