Physical properties of CdTeSb thin films

Picos-Vega, A.; Ramı́rez-Bon, R.; Espinoza‐Beltrán, F.J.; Zelaya-Ángel, O.; Álvarez-Fregoso, O.; Mendoza-Álvarez, J.G.

doi:10.1016/s0040-6090(96)09028-1

Cited by 5 publications

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“…Similar x-ray results have been reported for pure CdTe sputtered films. 7,15 The ͑111͒ diffraction line from the x-ray data is shown in Fig. 1 for samples C1, C2, C3, C4, C5, and C7.…”

Section: Resultsmentioning

confidence: 99%

“…An important reduction in the cost of solar cells can be achieved by preparing doped polycrystalline thin films of appropriate quality. CdTe polycrystalline films can be prepared by several growth techniques such as thermal evaporation, 1-3 closed-space vapor transport, 4,5 rf sputtering, [6][7][8][9][10][11] etc. In order to get optoelectronic grade material with the desirable properties, it is necessary to conduct an intensive investigation of the influence of the growth parameters on the physical properties of the produced materials.…”

Section: Introductionmentioning

confidence: 99%

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Cd self-doping of CdTe polycrystalline films by co-sputtering of CdTe–Cd targets

Picos-Vega

Becerril

Zelaya-Ángel

et al. 1998

Journal of Applied Physics

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Cadmium self-doped CdTe polycrystalline films were grown on Corning glass substrates at room temperature by cosputtering from a CdTe-Cd target. The electrical, structural, and optical properties of the films were analyzed as a function of the Cd concentration. Films with a stoichiometric composition, and slightly below and above it, were prepared. In films where the Te exceeds 50 at. %, it is found segregation of Te and its electrical resistivity is about 10 7 ⍀ cm. In those with an excess of Cd, the electrical resistivity drops several orders of magnitude, the carrier concentration increases, and the resistivity activation energy drops. From these results, we concluded that using this deposition method, n-type Cd self-doped CdTe polycrystalline films can be produced.

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“…Similar x-ray results have been reported for pure CdTe sputtered films. 7,15 The ͑111͒ diffraction line from the x-ray data is shown in Fig. 1 for samples C1, C2, C3, C4, C5, and C7.…”

Section: Resultsmentioning

confidence: 99%