1981
DOI: 10.1016/0038-1098(81)90733-x
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Photovoltaic effect in cuprous oxide-copper junctions in relation to the optical absorption spectrum of cuprous oxide

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Cited by 30 publications
(18 citation statements)
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“…These results stand in contradiction to those reported for similar cells for many years [2][3][4][5][6][7] and also in a recent publication [8]. It should be recalled that the Cu|Cu 2 O Schottky junction served as the rectifying device before the Si era [2][3][4][5][6][7] and found interest in solar collector research more recently [9][10][11][12]. Typical I-V relations reported in those references are shown qualitatively in Figs.…”
Section: Israelcontrasting
confidence: 81%
“…These results stand in contradiction to those reported for similar cells for many years [2][3][4][5][6][7] and also in a recent publication [8]. It should be recalled that the Cu|Cu 2 O Schottky junction served as the rectifying device before the Si era [2][3][4][5][6][7] and found interest in solar collector research more recently [9][10][11][12]. Typical I-V relations reported in those references are shown qualitatively in Figs.…”
Section: Israelcontrasting
confidence: 81%
“…much smaller than the internal resistance of the cell. This paper discusses in detail the PVE and other measurements on three samples, labelled S1, S2, and 53, prepared under similar conditions as described for a different set of cells in our previous paper [7]. The details of preparation are summarized in Table 1.…”
Section: Methodsmentioning
confidence: 99%
“…3 a to c the optical absorption curves of Cu,O layer, ace,., are shown for the comparison with the calculated absorption coefficients, &,&I. The absorption coefficient oceXp of the samples polished on both sides was measured in a manner identical to that described in [8] and subsequently used in [7]. The sample was placed at the exit slit of a glass prism double monochromator with a photoniultiplier detector immediately behind the sample.…”
Section: Optical Absorption Coefficient Of the Double Annealed Coppermentioning
confidence: 99%
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“…2,3,6,7 It is an intrinsic p-type semiconductor with relatively high absorbance in the visible region above the gap. 2 Finally, minority carrier diffusion lengths of 10 mm and hole mobilities of up to 100 cm 2 V À1 s À1 have also been reported for Cu 2 O made by thermal oxidation.…”
Section: Introductionmentioning
confidence: 99%