2007
DOI: 10.1007/s10832-007-9049-y
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Photoresist patterned thick-film piezoelectric elements on silicon

Abstract: A fundamental limitation of screen printing is the achievable alignment accuracy and resolution. This paper presents details of a thick-resist process that improves both of these factors. The technique involves exposing/developing a thick resist to form the desired pattern and then filling the features with thick film material using a doctor blading process. Registration accuracy comparable with standard photolithographic processes has been achieved resulting in minimum feature sizes of <50 μm and a film thick… Show more

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Cited by 6 publications
(6 citation statements)
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“…While producing well-formed high aspect ratio features up to 100 μm in height [13], BPR100 is not easy to dispense due to its viscosity. It is thus difficult to prevent bubbles from entering and making the photoresist nonuniform [14]. Also, development has to be done at raised temperatures and stripping requires mechanical agitation.…”
Section: Introductionmentioning
confidence: 99%
“…While producing well-formed high aspect ratio features up to 100 μm in height [13], BPR100 is not easy to dispense due to its viscosity. It is thus difficult to prevent bubbles from entering and making the photoresist nonuniform [14]. Also, development has to be done at raised temperatures and stripping requires mechanical agitation.…”
Section: Introductionmentioning
confidence: 99%
“…Then, the parts were immersed in a 20% KOH solution at a temperature of 80°C. This resulted in the PZT films peeling off from the silicon substrates in ∼10 min causing a slight damage to the films 24. Finally the mass of the films was measured using a precision electronic balance (OHAUS Corp, Pine Brook, NJ) after clearing Pt/Ti/SiO 2 debris and drying.…”
Section: Resultsmentioning
confidence: 99%
“…This resulted in the PZT films peeling off from the silicon substrates in B10 min causing a slight damage to the films. 24 Finally the mass of the films was measured using a precision electronic balance (OHAUS Corp, Pine Brook, NJ) after clearing Pt/Ti/SiO 2 debris and drying. Earlier, Nelson detailed various sets of dielectric mixture equations considering the dielectric constant and density of different materials and can often be used to predict the density of films from its dielectric constant value or vice versa.…”
Section: Resultsmentioning
confidence: 99%
“…For achieving higher resist thicknesses, multiple coatings using the positive AZ photoresist providing thicknesses of up to 100 lm were investigated by Frood et al (2007). Several photoresists have been developed for high thicknesses up to 100 lm in single spin coating step such as AR-N 4400 (CAR 44) from ALLRESIST (2007), Epoclad from Micro resist technology (2007), and KMPR 1000 (Ito et al 2005).…”
Section: Technology Development For High Aspect Ratio Micromoldsmentioning
confidence: 99%