2005
DOI: 10.1016/j.apsusc.2005.01.076
|View full text |Cite
|
Sign up to set email alerts
|

Photoluminescence characterization of pure and Sm3+-doped thin metaloxide films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

2
42
1

Year Published

2007
2007
2021
2021

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 56 publications
(48 citation statements)
references
References 32 publications
2
42
1
Order By: Relevance
“…Thus emitting properties of Sm 3+ ions confined in the TiO 2 :Ag host matrix are investigated in this paper. In contrast to the previous papers [9][10][11][12] dealing with Sm 3+ fluorescence in neat and doped oxide matrices, the present investigation revealed considerable (up to 20 times) enhancement of Sm 3+ fluorescence near the silver dopant under direct excitation. The possible roots of this enhancement are discussed.…”
Section: Introductioncontrasting
confidence: 53%
See 3 more Smart Citations
“…Thus emitting properties of Sm 3+ ions confined in the TiO 2 :Ag host matrix are investigated in this paper. In contrast to the previous papers [9][10][11][12] dealing with Sm 3+ fluorescence in neat and doped oxide matrices, the present investigation revealed considerable (up to 20 times) enhancement of Sm 3+ fluorescence near the silver dopant under direct excitation. The possible roots of this enhancement are discussed.…”
Section: Introductioncontrasting
confidence: 53%
“…Energies of some electronic transitions in silver ions may come to resonance with Sm 3+ − transitions. For example, bands 4d 10 →4d 9 5s 1 of separated Ag + ions and 4d 10 5s→4d 10 5p of (Ag 2 ) + pairs lie near the wavelength 450 nm [12] which is close to transition 6 H 5/2 → 4 I 15/2 of Sm 3+ ion [9]. Thus non-radiative energy transfer from silver ions to Sm 3+ centers could increase excitation efficiency of fluorophore.…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…For example, the scatter of the band gap width is in the interval from 6.15 [1] to 4.2 eV [2] and considerably depends on the techniques for production and synthesis and annealing modes. We are aware of a number of papers [1, 3,5], where the luminescence of HfO 2 /Si films produced by Atomic Layer Deposition technique (ALD) is studied. The luminescence spectra were obtained with a pulsed ArF excimer laser (λ rad ≅ 193 nm).…”
Section: Introductionmentioning
confidence: 99%