Photoelectric Analysis of Polarized Light

Budde, Wolfgang

doi:10.1364/ao.1.000201

Cited by 68 publications

(18 citation statements)

References 6 publications

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“…In general, the temperature for the non-equilibrium epitaxial growth of Bi:YIG films decreases as the content of bismuth increases, which is consistent with the report on the reduction of the preparation tem-rotation angles were then calculated using a Fourier transform procedure. 15) Since the samples absorb UV light above 3.5 eV, the rotation spectra were taken from 1.5 only up to 3.5 eV by scanning a monochromator. Care was taken to eliminate the combined polarization effect of the monochromator and the photomultiplier detector.…”

Section: Methodsmentioning

confidence: 99%

Red Shift of Faraday Rotation in Thin Films of Completely Bismuth-Substituted Iron Garnet Bi₃Fe₅O₁₂

Chern

Liu

et al. 1999

Jpn. J. Appl. Phys.

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The magnetooptical Faraday rotations of epitaxial films of Bi x Y3-x Fe5O12 (Bi:YIG) grown on [111]-oriented gadolinium gallium garnet (GGG) substrates by pulsed laser deposition (PLD) were studied with bismuth content x = 0.5, 1.0, 1.5, 2.0, 2.5, and 3.0. The Faraday rotation angles, θF, of the films were measured by the method of rotating analyzer ellipsometry (RAE) with the photon energy varied from 1.5 to 3.5 eV. It was shown that in addition to the increase of the Faraday rotation with increasing x, the peaks of θF shifted toward the red region as x changed from 1.0 to 1.5. The peak positions of θF for the completely Bi-substituted iron garnet, Bi3Fe5O12 (BIG), were found at 2.4 and 2.8 eV with peak values as large as -23 deg/µm and 44 deg/µm, respectively

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Section: Methodsmentioning

confidence: 99%

Red Shift of Faraday Rotation in Thin Films of Completely Bismuth-Substituted Iron Garnet Bi₃Fe₅O₁₂

Chern

Liu

et al. 1999

Jpn. J. Appl. Phys.

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“…However, PME also has a fatal flaw same to phase modulated null ellipsometer: as a key component, the modulator crystal is very sensitive to temperature drift, measurement error will significantly increase if not used in constant temperature, and the entire build process is complicated, so the cost is relatively high. Mechanically rotating photometric ellipsometer can divided into rotating polarizer ellipsometer (RPE), rotating analyzer ellipsometer (RAE) [23,24], rotating polarizer and analyzer ellipsometer (RPAE) [25,26] and rotating compensator ellipsometer (RCE) [27]. In 1975, P. S. Hauge et al applied rotating compensator into RCE for the first time.…”

Section: Photometric Ellipsometermentioning

confidence: 99%

“…Except the application in parallel measurement, the RPE is not as useful as RAE. In addition to C. V. Kent [18], the first RAE was built in 1962 by W. Budde [23]. In 1969, B. D. Cahan developed the first automated photometric ellipsometer using RAE-based structure [24].…”

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confidence: 99%

Ellipsometry and Its Applications in Stoichiometry

Zheng¹,

Zhang²,

Chen³

2012

Stoichiometry and Materials Science - When Numbers Matter

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“…͑6a͒ and ͑6b͒, without measuring the direct current ͑dc͒ component I 0 in which the background signal is included, the ellipsometric parameters can be extracted in terms of the ratio of the alternating current ͑ac͒ components in the subsequent data reduction. Without using a special way to correct the background current I B as was done in many experiments, 18,19 the signal noise from the background arising from the infrared detector and atmosphere can be suppressed effectively.…”

Section: ͑3͒mentioning

confidence: 99%

New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms

Xia

Zhang

Chen

et al. 2000

Review of Scientific Instruments

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Articles you may be interested inSynchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability Rev. Sci. Instrum. 84, 023901 (2013); 10.1063/1.4789495 Development of new in situ observation system for dynamic study of lubricant molecules on metal friction surfaces by two-dimensional fast-imaging Fourier-transform infrared-attenuated total reflection spectrometer Rev. Sci. Instrum. 79, 123702 (2008); 10.1063/1.2987685 Fourier transform infrared spectroscopy for Mars science Rev. Sci. Instrum. 76, 034101 (2005); 10.1063/1.1867012 Quantitative modulated excitation Fourier transform infrared spectroscopy Rev.Development of an infrared absorption measurement method using the photothermal deflection effect of thallium bromide iodide (KRS-5): Measurement with a stepped-scan Fourier transform infrared spectrometer Rev.A new type of incidence-angle-variable infrared spectroscopic ellipsometer working in the 2100-10 000 wave number range has been designed and constructed. For the system, the analyzer and polarizer were driven by two microstepping motors having hollow shafts and rotating synchronously with a speed ratio of 2:1, i.e., Aϭ2 P. The incidence angle can be varied from 30°to 90°with an accuracy of 0.01°. The doubled Fourier transforms as both functions of the wave number and the azimuthal angles of the polarizer and analyzer were carried out and integrated in the system. Two sets of ellipsometric parameters measured in the experiment have been used to test the data self-consistency of the system. In data reduction, the error arising from the slight anisotropy of the stray light was corrected. In application, the complex dielectric function of the Au film was measured with a data accuracy better that 1% in the entire spectral range.

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Photoelectric Analysis of Polarized Light

Cited by 68 publications

References 6 publications

Red Shift of Faraday Rotation in Thin Films of Completely Bismuth-Substituted Iron Garnet Bi₃Fe₅O₁₂

Red Shift of Faraday Rotation in Thin Films of Completely Bismuth-Substituted Iron Garnet Bi₃Fe₅O₁₂

Ellipsometry and Its Applications in Stoichiometry

New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms

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Photoelectric Analysis of Polarized Light

Cited by 68 publications

References 6 publications

Red Shift of Faraday Rotation in Thin Films of Completely Bismuth-Substituted Iron Garnet Bi3Fe5O12

Red Shift of Faraday Rotation in Thin Films of Completely Bismuth-Substituted Iron Garnet Bi3Fe5O12

Ellipsometry and Its Applications in Stoichiometry

New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms

Contact Info

Product

Resources

About

Red Shift of Faraday Rotation in Thin Films of Completely Bismuth-Substituted Iron Garnet Bi₃Fe₅O₁₂

Red Shift of Faraday Rotation in Thin Films of Completely Bismuth-Substituted Iron Garnet Bi₃Fe₅O₁₂