Phase properties of multilayers

Tikhonravov, Alexander V.; Baumeister, Philip; Попов, К. В.

doi:10.1364/ao.36.004382

Cited by 36 publications

(24 citation statements)

References 8 publications

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“…The origin of these oscillations is explained in Ref. [20] on the basis of the general analytical properties of the spectral characteristics of optical coatings [21]. Because this topic has no direct bearing on the main goal of our paper, we do not discuss it here and refer the interested reader to Ref.…”

Section: Numerical Study Of Sequences Of Optimal Antireflection Designsmentioning

confidence: 99%

Estimation of the average residual reflectance of broadband antireflection coatings

et al. 2007

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Estimation of the average residual reflectance of broadband antireflection coatingsWe deal with optimal two-material antireflection (AR) coatings for the visible and adjacent spectral regions. It has been shown before that, for a given set of input parameters (refractive indices of the substrate, ambient medium and high-and low-index coating materials, and for a given spectral width of the AR coating), such designs consist of one or more clusters of layers of approximately constant optical thickness and number of layers. We show that, through the analysis of many different optimal coatings, it is possible to derive two parameters for a simple empirical expression that relates the residual average reflectance in the AR region to the number of clusters. These parameters are given for all possible combinations of relative spectral bandwidth equal to 2, 3, and 4; low-index to ambient-medium index ratio equal to 1.38 and 1.45; and high-to-low index ratio equal to 1.4, 1.5, and 1.7. The agreement between the numerically and the empirically calculated values of residual average reflectance is excellent. From the information presented the optical thin-film designer can quickly calculate the required number of layers and the overall optical thickness of an AR coating having the desired achievable residual average reflectance.

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Section: Numerical Study Of Sequences Of Optimal Antireflection Designsmentioning

confidence: 99%

Estimation of the average residual reflectance of broadband antireflection coatings

et al. 2007

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“…In this paper, we use the techniques derived in [15] to show new properties of reflection and transmission coefficients of multilayered stacks. First, the usual analytic properties with respect to the complex frequency z, currently stated at normal incidence [11,16], are gener-alized to the complex wavevector k. This new property extends the possibility to use the analyticity for all angles of incidence from 0 to 90 degrees. Next, a second property, denominated by "passivity property", shows that the sum of the reflection coefficient with a phase shift, exp[−iβ • (ω, k)d]+r(ω, k), cannot vanish in an appropriate domain of the complex frequency and wavevector.…”

Section: Introductionmentioning

confidence: 99%

Phase retrieval of reflection and transmission coefficients from Kramers–Kronig relations

et al. 2015

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Analytic and passivity properties of reflection and transmission coefficients of thin-film multilayered stacks are investigated. Using a rigorous formalism based on the inverse Helmholtz operator, properties associated to causality principle and passivity are established when both temporal frequency and spatial wavevector are continued in the complex plane. This result extends the range of situations where the Kramers-Kronig relations can be used to deduce the phase from the intensity. In particular, it is rigorously shown that Kramers-Kronig relations for reflection and transmission coefficients remain valid at a fixed angle of incidence. Possibilities to exploit the new relationships are discussed.

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“…shows Transmission phase at normal incidence of light where at this low pass filter with its stack configuration the pass band from 400 -695 nm means the multiple reflections rays are in phase, and at stop band from 735 -1085 nm means the multiple reflections are not in phase, destructive interference reduces the transmission of these wavelengths through the device to near zero. In addition, The thicker the dielectric stack, the most rapidly admittance changes between two given wavelengths, which is also why the high resolution coating shows a very rapid variation of the phase with wavelength [29][30][31][32][33] . When the angle of incident has increased, the stop band would be shifted to left in the direction of short wavelengths and amount of energy has been entered from the infrared region which has been reflected (stopped).…”

Section: Figure (2)mentioning

confidence: 99%

Study New Design of Edge Filter of a 1D-Photonic Crystal using Ta2O5/SiO2 Thin Films

2020

JCBSC

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A new multilayer thin film edge filter design has been demonstrated in this study. A design of one-dimensional photonic crystal (PC) structure consisting of alternate layers of Silicon dioxide (SiO 2) and Tantalum pentoxide (Ta 2 O 5) that blocks infrared light and passes only light of short wavelengths. The design was done with the computational help of optimization using the "Essential Macleod" software. The resolution of the short wave pass (SWP) edge filter is studied .The properties of the initial and optimal edge filter design by varying the angle of incidence of light at TE (s-polarization), TM (p-polarization) and mean polarization modes have been investigated. Results show a new design for optimal edge filter of optical shortwave pass (SWP) that can be used as a smart energy saving window.

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Phase properties of multilayers

Cited by 36 publications

References 8 publications

Estimation of the average residual reflectance of broadband antireflection coatings

Estimation of the average residual reflectance of broadband antireflection coatings

Phase retrieval of reflection and transmission coefficients from Kramers–Kronig relations

Study New Design of Edge Filter of a 1D-Photonic Crystal using Ta2O5/SiO2 Thin Films

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