Study New Design of Edge Filter of a 1D-Photonic Crystal using Ta2O5/SiO2 Thin Films

Abstract

A new multilayer thin film edge filter design has been demonstrated in this study. A design of one-dimensional photonic crystal (PC) structure consisting of alternate layers of Silicon dioxide (SiO 2) and Tantalum pentoxide (Ta 2 O 5) that blocks infrared light and passes only light of short wavelengths. The design was done with the computational help of optimization using the "Essential Macleod" software. The resolution of the short wave pass (SWP) edge filter is studied .The properties of the initial and optimal edge filter design by varying the angle of incidence of light at TE (s-polarization), TM (p-polarization) and mean polarization modes have been investigated. Results show a new design for optimal edge filter of optical shortwave pass (SWP) that can be used as a smart energy saving window.