Phase information in transmission electron-microscope investigation of defects dynamic images with a weak amplitude contrast

Боргардт, Н. И.; Maksimov, S. K.; Piskunov, D. I.

doi:10.1002/pssa.2210860104

Cited by 9 publications

(2 citation statements)

References 7 publications

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“…The intensity distribution for the transmitted and diffracted waves in point re on the exit surface of the crystal is fully determined by the wave function [5],…”

Section: Images Of Imperfect Crystalsmentioning

confidence: 99%

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Specific Features of Electron Microscopy Images of Systems of Dilatation-Type Defects

Maksimov¹,

Ovcharov²,

Piskunov³

1987

Phys. Stat. Sol. (a)

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“…The intensity distribution for the transmitted and diffracted waves in point re on the exit surface of the crystal is fully determined by the wave function [5],…”

Section: Images Of Imperfect Crystalsmentioning

confidence: 99%

“…Such micrographs can be used for the identification of various imperfections. I n some cases, where the focused individual micrographs show no black-andwhite contrast, defocusirig can be used in order to obtain asymmetric black-andwhite images or to identify imperfections [5].…”

Section: Introductionmentioning

confidence: 99%

Specific Features of Electron Microscopy Images of Systems of Dilatation-Type Defects

Maksimov¹,

Ovcharov²,

Piskunov³

1987

Phys. Stat. Sol. (a)

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Focus Dependence of the Black-White Contrast of Small Point Defect Clusters on Transmission Electron Microscope Images of Crystalline Specimens

Gruschel¹,

Wilkens²

1985

phys. stat. sol. (a)

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The diffraction contrast is investigated of small lattice defects on transmission electron microscope images taken with the objective lens focused onto a plane at distance ζ(|ζ|≧ 1μm) apart from the lower specimen surface (out‐of focus contrast). A method is developed for calculating the out of focus contrast in terms of the scattering matrix M as introduced by Häussermann et al. and Katerbau. Starting from an analytical representation of M, adjusted to a two‐dimensional set of data numerically calculated for a small dislocation loop of vacancy type, expressions for the strength of the black—white contrast of small lattice defects are derived. These expressions, which dapend on ζ and are essentially based on the symmetry relations of M as established by Katerbau, are worked out in particular for the so‐called thin‐foil case where the black‐white contrast of small lattice defects vanished under infocus conditions (ζ = 0).

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Calculated Defocus Diffraction Contrast and Lattice Fringe Imaging of Small Crystal Defects

Scheerschmidt¹,

Hillebrand²

1985

phys. stat. sol. (a)

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I n transmission electron microscopy of crystal lattice defects, the imaging of details smaller than a few nanometres requires the consideration of the electron optical imaging process in addition to the study of the interaction between electron beam and crystal. A method is described combining the calculation of diffraction contrast amplitudes with the Fourier transformation formalism for simulating bright-or dark-field diffraction contrasts and lattice fringe images of arbitrarily small crystal defects. Simulated images are presented demonstreting the npplica,bility of this method and the significance of microscope aberrations for the interpretation of diffraction contrast and lattice fringe images. Die Erfassung von Kontrastdetails kleiner als einige Nanometer bei der Kristallgitter-Defektabbildung im Transmissionselektronenmikroskop erfordert die gleichzeitige Untersucliung des elektronenoptischen Prozesses und des JVechselwirkungsprozesses zwischen Elektronenstrahl und Kristall. E Y wird eine Methode beschrieben, die die Kombination der Berechnung der Beugungskontrastamplitudcn mit dem Formalismus der Fouriertransformation ermoglicht, um Hellfeld-oder Dunkelfcld-Beugungskontrast und Netzebenenabbildung fur beliebig klein Kristalldefekte zu simulicren. Es wcrden simulierte Abbildungen kleiner Kristalldefekte unt.ersucht, um die Anaendbarkeit der entwickelten Methode zu demonstrieren und die Bedeutung der elektronenoptischen Aberrationen fur die Interpretation von Beugungskontrast und Netzebenenabbildungen aufzuzeigen. 30*

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Phase information in transmission electron-microscope investigation of defects dynamic images with a weak amplitude contrast

Cited by 9 publications

References 7 publications

Specific Features of Electron Microscopy Images of Systems of Dilatation-Type Defects

Specific Features of Electron Microscopy Images of Systems of Dilatation-Type Defects

Focus Dependence of the Black-White Contrast of Small Point Defect Clusters on Transmission Electron Microscope Images of Crystalline Specimens

Calculated Defocus Diffraction Contrast and Lattice Fringe Imaging of Small Crystal Defects

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