2018
DOI: 10.1016/j.spmi.2017.10.012
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Performance improvement of doped TFET by using plasma formation concept

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Cited by 24 publications
(11 citation statements)
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“…For both the devices, the design parameters considered are shown in Table 1. Simulation has been performed using Silvaco Atlas simulator, for this non‐local BTBT model and bandgap narrowing (BGN) model is considered for the calculation of the tunnelling rate of charge carriers [19, 24, 25] in the simulation. Shockley–Read–Hall recombination and Auger recombination is activated by SRH and AUGER parameter, respectively [25, 26].…”
Section: Device Structure and Simulation Setupmentioning
confidence: 99%
See 1 more Smart Citation
“…For both the devices, the design parameters considered are shown in Table 1. Simulation has been performed using Silvaco Atlas simulator, for this non‐local BTBT model and bandgap narrowing (BGN) model is considered for the calculation of the tunnelling rate of charge carriers [19, 24, 25] in the simulation. Shockley–Read–Hall recombination and Auger recombination is activated by SRH and AUGER parameter, respectively [25, 26].…”
Section: Device Structure and Simulation Setupmentioning
confidence: 99%
“…The negative voltage over source region induces the holes at the surface of the Si/HfO 2 interface, creates a plasma layer of the hole at the silicon/HfO 2 interface and overcomes the limitation of solubility. Holes layer at the interface in the source region creates abruptness at the source-channel junction, increases the drain current [19]. Further, the cavity in the proposed structure is extended from the gate dielectric region to source dielectric region.…”
Section: Introductionmentioning
confidence: 99%
“…Researchers have commonly used FET-based biosensors for their ability of label-free detection, CMOS compatibility, cost-effectiveness, and miniaturization [ 5 7 ]. But the downside of these FET-based biosensors is short channel effects (SCEs) and large subthreshold swings (SS> 60 mV/decade) [ 8 – 10 ].…”
Section: Introductionmentioning
confidence: 99%
“…Various structural and material‐based solutions have been proposed to boost the ON state performance of TFETs 5‐11 . The charge plasma‐based structure has also been reported to improve the performance of TFET device 12 in which the source and drain are not doped, instead the charge concentration is induced through metal, when metal is brought in contact with semiconductor contacts, provided some conditions on work function and film thickness are satisfied 13,14 . GeSn‐based homojunction and heterojunction TFET have also been reported to improve the ON current of TFET 15‐17 .…”
Section: Introductionmentioning
confidence: 99%