2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013) 2013
DOI: 10.1109/eptc.2013.6745713
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Performance enhancement of Au-Ge eutectic alloys for high-temperature electronics

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Cited by 2 publications
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“…[26] It was 294 found that the thermal resistance from junction to case 295 increased from 0.92 to 1. 53 [8][9][10][11][12][15][16][17]19,20,22,28,31,[34][35][36]49] Various samples tested at room temperature are compiled in the 'Nominal' series. Dashed lines are curve fits for each series.…”
Section: B Electrical Evaluationmentioning
confidence: 99%
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“…[26] It was 294 found that the thermal resistance from junction to case 295 increased from 0.92 to 1. 53 [8][9][10][11][12][15][16][17]19,20,22,28,31,[34][35][36]49] Various samples tested at room temperature are compiled in the 'Nominal' series. Dashed lines are curve fits for each series.…”
Section: B Electrical Evaluationmentioning
confidence: 99%
“…[48] Near eutectic compositions have an irregular lamellar type microstructure, see Figure 2(a). [8,9,12,15,16,19,20,23,27,49] Another common microstructure found in literature is colonies of Ge dispersed in a Au matrix, [8,9] see Figure 2(b). This second microstructure is especially common after thermal aging which typically coarsens the grain structure.…”
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