2000
DOI: 10.1364/ao.39.006818
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Performance and design of InGaAs/InP photodiodes for single-photon counting at 155 µm

Abstract: The performance of selected, commercially available InGaAs/InP avalanche photodiodes operating in a photon-counting mode at an incident wavelength of 1.55 microm is described. A discussion on the optimum operating conditions and their relationship to the electric field distribution within the device is presented.

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Cited by 123 publications
(77 citation statements)
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“…3) The mask design incorporates different diffused area curvatures in order to accommodate the smaller volume structures needed for low DCRs whilst avoiding edge breakdown effects, such as the 10-µm diameter devices (see later). The specific choice of the zinc diffused planar geometry was based on previous studies done by our research groups, which highlighted consistently lower DCRs in devices fabricated using this approach [6], [7], [14]. The device material was grown epitaxially by metal organic chemical vapor deposition.…”
Section: Device Structurementioning
confidence: 99%
See 1 more Smart Citation
“…3) The mask design incorporates different diffused area curvatures in order to accommodate the smaller volume structures needed for low DCRs whilst avoiding edge breakdown effects, such as the 10-µm diameter devices (see later). The specific choice of the zinc diffused planar geometry was based on previous studies done by our research groups, which highlighted consistently lower DCRs in devices fabricated using this approach [6], [7], [14]. The device material was grown epitaxially by metal organic chemical vapor deposition.…”
Section: Device Structurementioning
confidence: 99%
“…More recently they have been employed in quantum key distribution [4] and noninvasive testing of VLSI circuits [5]. Commercially available InGaAs-InP avalanche photodiodes (APDs) designed for use in linear multiplication mode have been tested in Geiger mode [6], [7] in order to extend the spectral range of efficient single-photon detection to wavelengths greater than that afforded by the currently available Si-based single-photon avalanche diode (SPAD) detectors (i.e., wavelengths greater than 1 m). These InGaAs-InP detectors have exhibited good single-photon detection efficiency (SPDE) (SPDE > 10%) and subnanosecond timing jitter, however they have limited counting rates due to the severe deleterious effects of the afterpulsing phenomenon.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, the performance of InGaAs APDs as single-photon detectors for use in the fiber communication window around 1550 nm has been extensively studied by several groups [9]- [12]. The pulsed nature of the photon pairs allows us to use the APDs in a gated Geiger mode.…”
mentioning
confidence: 99%
“…9a) have a distinct unity gain reference voltage, called the punch-through voltage [53], at which the electric field penetrates into the absorption region. Below this voltage, photogenerated carriers cannot travel through all layers of the device to reach the electrode to produce photocurrent before they recombine.…”
Section: Design Criteriamentioning
confidence: 99%